Enhanced Carrier Injection Across S/D Contacts in Selenium Based TMD FETs Using KI & Metal Induced Gap-States Engineering
Hemanjaneyulu, Kuruva, Kumar, Jeevesh, Patbhaje, Utpreksh, Shrivastava, Mayank
Published in IEEE journal of the Electron Devices Society (01.01.2024)
Published in IEEE journal of the Electron Devices Society (01.01.2024)
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Journal Article
Fin Enabled Area Scaled Tunnel FET
Hemanjaneyulu, Kuruva, Shrivastava, Mayank
Published in IEEE transactions on electron devices (01.10.2015)
Published in IEEE transactions on electron devices (01.10.2015)
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Journal Article
MoS2 Doping Using Potassium Iodide for Reliable Contacts and Efficient FET Operation
Hemanjaneyulu, Kuruva, Kumar, Jeevesh, Shrivastava, Mayank
Published in IEEE transactions on electron devices (01.07.2019)
Published in IEEE transactions on electron devices (01.07.2019)
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Journal Article
Unveiling Unintentional Fluorine Doping in TMDs During the Reactive Ion Etching: Root Cause Analysis, Physical Insights, and Solution
Hemanjaneyulu, Kuruva, Meersha, Adil, Kumar, Jeevesh, Shrivastava, Mayank
Published in IEEE transactions on electron devices (01.04.2022)
Published in IEEE transactions on electron devices (01.04.2022)
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Journal Article
Chalcogen-Assisted Enhanced Atomic Orbital Interaction at TMD-Metal Interface and Sulfur Passivation for Overall Performance Boost of 2-D TMD FETs
Ansh, Shrivastava, Mayank, Kumar, Jeevesh, Sheoran, Gaurav, Variar, Harsha B., Mishra, Ravikesh, Kuruva, Hemanjaneyulu, Meersha, Adil, Mishra, Abhishek, Raghavan, Srinivasan
Published in IEEE transactions on electron devices (01.02.2020)
Published in IEEE transactions on electron devices (01.02.2020)
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Journal Article
Atomic-level Insight and Quantum Chemistry of Ambient Reliability Issues of the TMDs Devices
Kumar, Jeevesh, Kuruva, Hemanjaneyulu, Variar, Harsha B., Patbhaje, Utpreksh, Shrivastava, Mayank
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
Defect Assisted Metal-TMDs Interface Engineering: A First Principle Insight
Kumar, Jeevesh, Ansh, Ansh, Kuruva, Hemanjaneyulu, Shrivastava, Mayank
Published in 2020 Device Research Conference (DRC) (01.06.2020)
Published in 2020 Device Research Conference (DRC) (01.06.2020)
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Conference Proceeding
ESD Behavior of Fin based Tunnel FETs
Variar, Harsha B, Kranthi, Nagothu Karmel, Kuruva, Hemanjaneyulu, Shrivastava, Mayank
Published in 2022 IEEE International Conference on Emerging Electronics (ICEE) (11.12.2022)
Published in 2022 IEEE International Conference on Emerging Electronics (ICEE) (11.12.2022)
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Conference Proceeding
Comprehensive Computational Modelling Approach for Graphene FETs
Hemanjaneyulu, Kuruva, Khaneja, Mamta, Meersha, Adil, Variar, Harsha B, Shrivastava, Mayank
Published in 2018 4th IEEE International Conference on Emerging Electronics (ICEE) (01.12.2018)
Published in 2018 4th IEEE International Conference on Emerging Electronics (ICEE) (01.12.2018)
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Conference Proceeding
Chalcogen Assisted Enhanced Atomic Orbital Interaction at TMDs - Metal Interface & Chalcogen Passivation of TMD Channel For Overall Performance Boost of 2D TMD FETs
Ansh, Kumar, Jeevesh, Sheoran, Gaurav, Variar, Harsha B, Mishra, Ravi K, Kuruva, Hemanjaneyulu, Meersha, Adil, Mishra, Abhishek, Raghavan, Srinivasan, Shrivastava, Mayank
Published in arXiv.org (08.01.2019)
Published in arXiv.org (08.01.2019)
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Paper
Journal Article