by Heinemann, B, Barth, R, Bolze, D, Drews, J, Fischer, G G, Fox, A, Fursenko, O, Grabolla, T, Haak, U, Knoll, D, Kurps, R, Lisker, M, Marschmeyer, S, Rücker, H, Schmidt, D, Schmidt, J, Schubert, M A, Tillack, B, Wipf, C, Wolansky, D, Yamamoto, Y
Published in 2010 International Electron Devices Meeting (01.12.2010)

by Krüger, D., Efremov, A. A., Murota, J., Kurps, R., Bugiel, E., Tillack, B., Romanova, G. Ph
Published in Surface and interface analysis (01.08.2002)

by Winkler, W, Borngräber, J, Heinemann, B, Rücker, H, Barth, R, Bauer, J, Bolze, D, Drews, J, Ehwald, K.-E, Grabolla, T, Haak, U, Höppner, W, Knoll, D, Krüger, D, Kuck, B, Kurps, R, Marschmeyer, M, Richter, H, Schley, P, Schmidt, D, Scholz, R, Tillack, B, Wolansky, D, Wulf, H.-E, Yamamoto, Y, Zaumseil, P
Published in Applied surface science (15.03.2004)

by Krüger, D., Gaworzewski, P., Kurps, R., Pomplun, K.
Published in Microelectronics and reliability (01.08.2000)

by Heinemann, B., Rucker, H., Barth, R., Bauer, J., Bolze, D., Bugiel, E., Drews, J., Ehwald, K.-E., Grabolla, T., Haak, U., Hoppner, W., Knoll, D., Kruger, D., Kuck, B., Kurps, R., Marschmeyer, M., Richter, H.H., Schley, P., Schmidt, D., Scholz, R., Tillack, B., Winkler, W., Wolnsky, D., Wulf, H.-E., Yamamoto, Y., Zaumseil, P.
Published in Digest. International Electron Devices Meeting (2002)

by Zeindl, H.P., Nilsson, S., Klatt, J., Krüger, D., Kurps, R.
Published in Journal of crystal growth (01.12.1995)

by Kruger, D, Kurps, R, Weidner, G
Published in Semiconductor science and technology (01.09.1993)

by Zeindl, H.P., Nilsson, S., Jagdhold, U., Klatt, J., Kurps, R., Krüger, D., Bugiel, E.
Published in Applied surface science (01.08.1996)

by Kruger, D, Gaworzewski, P, Kurps, R, Schlote, J
Published in Semiconductor science and technology (01.03.1995)

by Weidner, G., Kurps, R., Blum, K., Krüger, D.
Published in Microelectronic engineering (01.08.1993)

by Rucker, H., Heinemann, B., Barth, R., Bolze, D., Melnik, V., Kurps, R., Kruger, D.
Published in 32nd European Solid-State Device Research Conference (2002)

by Krüger, D., Lippert, G., Kurps, R., Osten, H.J.
Published in Journal of crystal growth (1994)

by Krüger, D., Schlote, J., Röpke, W., Kurps, R., Quick, Ch
Published in Microelectronic engineering (01.04.1995)

by Lischke, S., Knoll, D., Zimmermann, L., Scheit, A., Mai, C., Trusch, A., Voigt, K., Kroh, M., Kurps, R., Ostrovskyy, P., Yamamoto, Y., Korndorfer, F., Peczek, A., Winzer, G., Tillack, B.
Published in 2014 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) (01.09.2014)

by Knoll, D., Ehwald, K.E., Heinemann, B., Fox, A., Blum, K., Rucker, H., Furnhammer, F., Senapati, B., Barth, R., Haak, U., Hoppner, W., Drews, J., Kurps, R., Marschmeyer, S., Richter, H.H., Grabolla, T., Kuck, B., Fursenko, O., Schley, P., Scholz, R., Tillack, B., Yamamoto, Y., Kopke, K., Wulf, H.E., Wolansky, D., Winkler, W.
Published in Digest. International Electron Devices Meeting (2002)

by Yamamoto, Yuji, Zaumseil, Peter, Kurps, Rainer, Murota, Junichi, Tillack, Bernd
Published in ECS transactions (15.03.2013)

by Yamamoto, Yuji, Tillack, Bernd, Köpke, Klaus, Kurps, Rainer
Published in Thin solid films (05.06.2006)

by Heinemann, B., Barth, R., Bolze, D., Drews, J., Formanek, P., Grabolla, T., Haak, U., Hoppner, W., Kopke, D.K., Kuck, B., Kurps, R., Marschmeyer, S., Richter, H.H., Rucker, H., Schley, P., Schmidt, D., Winkler, W., Wolansky, D., Wulf, H.E., Yamamoto, Y.
Published in IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004 (2004)

by Heinemann, B., Barth, R., Bolze, D., Ehwald, K.-E., Knoll, D., Kruger, D., Kurps, R., Rucker, H., Schley, P., Tillack, B., Wolansky, D.
Published in International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) (2000)

by Rucker, Holger, Heinemann, Bernd, Kurps, Rainer, Yamamoto, Yuji
Published in ECS transactions (20.10.2006)