Report on IEDM 2018
Kuroda, Rihito
Published in The Journal of The Institute of Image Information and Television Engineers (2019)
Published in The Journal of The Institute of Image Information and Television Engineers (2019)
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Journal Article
Two High-Precision Proximity Capacitance CMOS Image Sensors with Large Format and High Resolution
Sugama, Yuki, Watanabe, Yoshiaki, Kuroda, Rihito, Yamamoto, Masahiro, Goto, Tetsuya, Yasuda, Toshiro, Hamori, Hiroshi, Kuriyama, Naoya, Sugawa, Shigetoshi
Published in Sensors (Basel, Switzerland) (04.04.2022)
Published in Sensors (Basel, Switzerland) (04.04.2022)
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Journal Article
[Paper] A 2-Tap 4-Phase Indirect Time-of-Flight Ranging Method using Half-Pulse Modulation for Depth Precision Enhancement and Sub-Frame Operation for Motion Artifact Suppression
Kuo, Chia-Chi, Kuroda, Rihito
Published in ITE TRANSACTIONS ON MEDIA TECHNOLOGY AND APPLICATIONS (2023)
Published in ITE TRANSACTIONS ON MEDIA TECHNOLOGY AND APPLICATIONS (2023)
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Journal Article
High capacitance density highly reliable textured deep trench SiN capacitors toward 3D integration
Saito, Koga, Yoshida, Ayano, Kuroda, Rihito, Shibata, Hiroshi, Shibaguchi, Taku, Kuriyama, Naoya, Sugawa, Shigetoshi
Published in Japanese Journal of Applied Physics (01.05.2021)
Published in Japanese Journal of Applied Physics (01.05.2021)
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Journal Article
A 70-dB SNR High-Speed Global Shutter CMOS Image Sensor for in Situ Fluid Concentration Distribution Measurements
Oikawa, Tetsu, Kuroda, Rihito, Takahashi, Keigo, Shiba, Yoshinobu, Fujihara, Yasuyuki, Shike, Hiroya, Murata, Maasa, Kuo, Chia-Chi, Silva, Yhang Ricardo Sipauba Carvalho da, Goto, Tetsuya, Suwa, Tomoyuki, Morimoto, Tatsuo, Shirai, Yasuyuki, Inada, Takafumi, Sakai, Yushi, Nagase, Masaaki, Ikeda, Nobukazu, Sugawa, Shigetoshi
Published in IEEE transactions on electron devices (01.06.2022)
Published in IEEE transactions on electron devices (01.06.2022)
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Journal Article
Hole-Trapping Process at Al2O3/GaN Interface Formed by Atomic Layer Deposition
Teramoto, Akinobu, Saito, Masaya, Suwa, Tomoyuki, Narita, Tetsuo, Kuroda, Rihito, Sugawa, Shigetoshi
Published in IEEE electron device letters (01.09.2017)
Published in IEEE electron device letters (01.09.2017)
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Journal Article
[Paper] High-Resolution Defect Detection for Flat Panel Display Using Proximity Capacitance Image Sensor
Yasuda, Toshiro, Sugawa, Shigetoshi, Kuroda, Rihito, Yokomichi, Yayoi, Kobayashi, Kazuhisa, Hamori, Hiroshi, Teramoto, Akinobu
Published in ITE TRANSACTIONS ON MEDIA TECHNOLOGY AND APPLICATIONS (2023)
Published in ITE TRANSACTIONS ON MEDIA TECHNOLOGY AND APPLICATIONS (2023)
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Journal Article
[Invited Paper] A High SNR Global Shutter CMOS Image Sensor Technology for High Precision Absorption Imaging Applications
Oikawa, Tetsu, Kuroda, Rihito, Hamaya, Aoi, Shiba, Yoshinobu, Inada, Takafumi, Sakai, Yushi, Shirai, Yasuyuki, Sugawa, Shigetoshi
Published in ITE TRANSACTIONS ON MEDIA TECHNOLOGY AND APPLICATIONS (2024)
Published in ITE TRANSACTIONS ON MEDIA TECHNOLOGY AND APPLICATIONS (2024)
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Journal Article
Experimental investigation of localized stress-induced leakage current distribution in gate dielectrics using array test circuit
Park, Hyeonwoo, Teramoto, Akinobu, Kuroda, Rihito, Suwa, Tomoyuki, Sugawa, Shigetoshi
Published in Japanese Journal of Applied Physics (01.04.2018)
Published in Japanese Journal of Applied Physics (01.04.2018)
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Journal Article
[Paper] Preserved Color Pixel: high-resolution and high-colorfidelity image acquisition using single image sensor with sub-half-micron pixels
Yamashita, Yuichiro, Kuroda, Rihito, Sugawa, Shigetoshi
Published in ITE TRANSACTIONS ON MEDIA TECHNOLOGY AND APPLICATIONS (2020)
Published in ITE TRANSACTIONS ON MEDIA TECHNOLOGY AND APPLICATIONS (2020)
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Journal Article
A Statistical Evaluation of Random Telegraph Noise of In-Pixel Source Follower Equivalent Surface and Buried Channel Transistors
Kuroda, Rihito, Yonezawa, Akihiro, Teramoto, Akinobu, Tsung-Ling Li, Tochigi, Yasuhisa, Sugawa, Shigetoshi
Published in IEEE transactions on electron devices (01.10.2013)
Published in IEEE transactions on electron devices (01.10.2013)
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Journal Article
Effect of drain current on appearance probability and amplitude of random telegraph noise in low-noise CMOS image sensors
Ichino, Shinya, Mawaki, Takezo, Teramoto, Akinobu, Kuroda, Rihito, Park, Hyeonwoo, Wakashima, Shunichi, Goto, Tetsuya, Suwa, Tomoyuki, Sugawa, Shigetoshi
Published in Japanese Journal of Applied Physics (01.04.2018)
Published in Japanese Journal of Applied Physics (01.04.2018)
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Journal Article
Atomically Flat Silicon Surface and Silicon/Insulator Interface Formation Technologies for (100) Surface Orientation Large-Diameter Wafers Introducing High Performance and Low-Noise Metal-Insulator-Silicon FETs
Kuroda, R., Suwa, T., Teramoto, A., Hasebe, R., Sugawa, S., Ohmi, T.
Published in IEEE transactions on electron devices (01.02.2009)
Published in IEEE transactions on electron devices (01.02.2009)
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Journal Article
[Invite Paper] High Accuracy High Spatial Resolution and Real-Time CMOS Proximity Capacitance Image Sensor Technology and its Applications
Kuroda, Rihito, Yamamoto, Masahiro, Sugama, Yuki, Watanabe, Yoshiaki, Suzuki, Manabu, Goto, Tetsuya, Yasuda, Toshiro, Murakami, Shinichi, Yokomichi, Yayoi, Hamori, Hiroshi, Sugawa, Shigetoshi
Published in ITE TRANSACTIONS ON MEDIA TECHNOLOGY AND APPLICATIONS (2021)
Published in ITE TRANSACTIONS ON MEDIA TECHNOLOGY AND APPLICATIONS (2021)
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Journal Article
[Paper] A 20Mfps Global Shutter CMOS Image Sensor with Improved Light Sensitivity and Power Consumption Performances
Kuroda, Rihito, Tochigi, Yasuhisa, Miyauchi, Ken, Takeda, Tohru, Sugo, Hidetake, Shao, Fan, Sugawa, Shigetoshi
Published in ITE TRANSACTIONS ON MEDIA TECHNOLOGY AND APPLICATIONS (2016)
Published in ITE TRANSACTIONS ON MEDIA TECHNOLOGY AND APPLICATIONS (2016)
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Journal Article