Microbeam SEE Analysis of MIM Capacitors for GaN Amplifiers
Kupsc, Pawel, Javanainen, Arto, Ferlet-Cavrois, Veronique, Muschitiello, Michele, Barnes, Andrew, Zadeh, Ali, Calcutt, Jordan, Poivey, Christian, Stieglauer, Hermann, Voss, Kay-Obbe
Published in IEEE transactions on nuclear science (01.02.2018)
Published in IEEE transactions on nuclear science (01.02.2018)
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