Tail bit implications in advanced 2 transistors-flash memory device reliability
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Plasma Charging Damage Reduction in IC Processing by A Self-balancing Interconnect
WANG, Z, ACKAERT, J, SALM, C, KUPER, F. G, DE BACKER, E
Published in Microelectronics and reliability (01.09.2004)
Published in Microelectronics and reliability (01.09.2004)
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Conference Proceeding
Progressive degradation in a-Si:H/SiN thin film transistors
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Conference Proceeding
A concept to relate wire bonding parameters to bondability and ball bond reliability
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Conference Proceeding
Dealing with hot-carrier aging in nMOS and DMOS, models, simulations and characterizations
Mouthaan, A.J, Salm, C, Lunenborg, M.M, de Wolf, M.A.R.C, Kuper, F.G
Published in Microelectronics and reliability (01.06.2000)
Published in Microelectronics and reliability (01.06.2000)
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Turn-on speed of grounded gate nMOS ESD protection transistors
Meneghesso, G., Luchies, J.R.M., Kuper, F.G., Mouthaan, A.J.
Published in Microelectronics and reliability (01.11.1996)
Published in Microelectronics and reliability (01.11.1996)
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Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs
Salm, C., Hof, A.J., Kuper, F.G., Schmitz, J.
Published in Microelectronics and reliability (01.09.2006)
Published in Microelectronics and reliability (01.09.2006)
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Conference Proceeding
Validating foundry technologies for extended mission profiles
van Dijk, K, Volf, P A J, Detcheverry, C, Yau, A, Ngan, P, Liang, Z, Kuper, F G
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
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Conference Proceeding
Analysis of the electrical breakdown in hydrogenated amorphous silicon thin-film transistors
Golo, N.T., Kuper, F.G., Mouthaan, T.J.
Published in IEEE transactions on electron devices (01.06.2002)
Published in IEEE transactions on electron devices (01.06.2002)
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Fast temperature cycling and electromigration induced thin film cracking in multilevel interconnection: experiments and modeling
Nguyen, H.V., Salm, C., Vroemen, J., Voets, J., Krabbenborg, B., Bisschop, J., Mouthaan, A.J., Kuper, F.G.
Published in Microelectronics and reliability (01.09.2002)
Published in Microelectronics and reliability (01.09.2002)
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Grounded-gate nMOS transistor behavior under CDM ESD stress conditions
Verhaege, K., Russ, C., Luchies, J.-M., Groeseneken, G., Kuper, F.G.
Published in IEEE transactions on electron devices (01.11.1997)
Published in IEEE transactions on electron devices (01.11.1997)
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Plasma-charging damage of floating MIM capacitors
Zhichun Wang, Ackaert, J., Salm, C., Kuper, F.G., Tack, M., De Backer, E., Coppens, P., Luc De Schepper, Vlachakis, B.
Published in IEEE transactions on electron devices (01.06.2004)
Published in IEEE transactions on electron devices (01.06.2004)
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MOSFET Degradation Under RF Stress
Sasse, G.T., Kuper, F.G., Schmitz, J.
Published in IEEE transactions on electron devices (01.11.2008)
Published in IEEE transactions on electron devices (01.11.2008)
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