Membrane lipid remodeling eradicates Helicobacter pylori by manipulating the cholesteryl 6'-acylglucoside biosynthesis
Ong, Lih-Lih, Jan, Hau-Ming, Le, Hong-Hanh Thi, Yang, Tsai-Chen, Kuo, Chou-Yu, Feng, Ai-Feng, Mong, Kwok-Kong Tony, Lin, Chun-Hung
Published in Journal of biomedical science (29.04.2024)
Published in Journal of biomedical science (29.04.2024)
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Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors
Chao, Calvin Yi-Ping, Yeh, Shang-Fu, Wu, Meng-Hsu, Chou, Kuo-Yu, Tu, Honyih, Lee, Chih-Lin, Yin, Chin, Paillet, Philippe, Goiffon, Vincent
Published in Sensors (Basel, Switzerland) (10.12.2019)
Published in Sensors (Basel, Switzerland) (10.12.2019)
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Journal Article
Statistical Analysis of the Random Telegraph Noise in a 1.1 μm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction Method
Chao, Calvin Yi-Ping, Tu, Honyih, Wu, Thomas Meng-Hsiu, Chou, Kuo-Yu, Yeh, Shang-Fu, Yin, Chin, Lee, Chih-Lin
Published in Sensors (Basel, Switzerland) (23.11.2017)
Published in Sensors (Basel, Switzerland) (23.11.2017)
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Journal Article
A 45 nm Stacked CMOS Image Sensor Process Technology for Submicron Pixel
Takahashi, Seiji, Huang, Yi-Min, Sze, Jhy-Jyi, Wu, Tung-Ting, Guo, Fu-Sheng, Hsu, Wei-Cheng, Tseng, Tung-Hsiung, Liao, King, Kuo, Chin-Chia, Chen, Tzu-Hsiang, Chiang, Wei-Chieh, Chuang, Chun-Hao, Chou, Keng-Yu, Chung, Chi-Hsien, Chou, Kuo-Yu, Tseng, Chien-Hsien, Wang, Chuan-Joung, Yaung, Dun-Nien
Published in Sensors (Basel, Switzerland) (05.12.2017)
Published in Sensors (Basel, Switzerland) (05.12.2017)
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Journal Article
Statistical Analysis of Random Telegraph Noises of MOSFET Subthreshold Currents Using a 1M Array Test Chip in a 40 nm Process
Chao, Calvin Yi-Ping, Wu, Meng-Hsu, Yeh, Shang-Fu, Chang, Chin-Hao, Lee, Chi-Lin, Yin, Chin, Chou, Kuo-Yu, Tu, Honyih
Published in IEEE journal of the Electron Devices Society (2021)
Published in IEEE journal of the Electron Devices Society (2021)
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Journal Article
Random Telegraph Noises in CMOS Image Sensors Caused by Variable Gate-Induced Sense Node Leakage Due to X-Ray Irradiation
Chao, Calvin Yi-Ping, Wu, Thomas M.-H., Yeh, Shang-Fu, Chou, Kuo-Yu, Tu, Honyih, Lee, Chih-Lin, Yin, Chin, Paillet, Philippe, Goiffon, Vincent
Published in IEEE journal of the Electron Devices Society (2019)
Published in IEEE journal of the Electron Devices Society (2019)
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Journal Article
CMOS Image Sensor Random Telegraph Noise Time Constant Extraction From Correlated To Uncorrelated Double Sampling
Chao, Calvin Yi-Ping, Honyih Tu, Wu, Thomas, Kuo-Yu Chou, Shang-Fu Yeh, Fu-Lung Hsueh
Published in IEEE journal of the Electron Devices Society (01.01.2017)
Published in IEEE journal of the Electron Devices Society (01.01.2017)
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Journal Article
Extraction and Estimation of Pinned Photodiode Capacitance in CMOS Image Sensors
Chao, Calvin Yi-Ping, Yi-Che Chen, Kuo-Yu Chou, Jhy-Jyi Sze, Fu-Lung Hsueh, Shou-Gwo Wuu
Published in IEEE journal of the Electron Devices Society (01.07.2014)
Published in IEEE journal of the Electron Devices Society (01.07.2014)
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Journal Article
Modeling and analysis of touch on flexible ultra-thin touch sensor panels for AMOLED displays employing finite element methods
Chou, Kuo-Yu, Chao, Paul C.-P., Chen, Chuan-Xin, Wu, Chang-Xian, Huang, Sheng-Chieh
Published in Microsystem technologies : sensors, actuators, systems integration (01.11.2017)
Published in Microsystem technologies : sensors, actuators, systems integration (01.11.2017)
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Journal Article
Active devices under CMOS I/O pads
Chou, Kuo-Yu, Chen, Ming-Jer, Liu, Chi-Wen
Published in IEEE transactions on electron devices (01.12.2002)
Published in IEEE transactions on electron devices (01.12.2002)
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Journal Article
Reliability of VLSI-level chip assembly for evaluating the development of back-end technologies using a test chip with a top two-level metal structure
CHOU, Kuo-Yu, CHEN, Ming-Jer, LIU, Chi-Wen, LIN, Bing-Hong
Published in IEEE transactions on device and materials reliability (01.09.2002)
Published in IEEE transactions on device and materials reliability (01.09.2002)
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