by Mulaosmanovic, H., Slesazeck, S., Ocker, J., Pesic, M., Muller, S., Flachowsky, S., Muller, J., Polakowski, P., Paul, J., Jansen, S., Kolodinski, S., Richter, C., Piontek, S., Schenk, T., Kersch, A., Kunneth, C., van Bentum, R., Schroder, U., Mikolajick, T.
Published in 2015 IEEE International Electron Devices Meeting (IEDM) (01.12.2015)

by Schroeder, U., Pesic, M., Schenk, T., Mulaosmanovic, H., Slesazeck, S., Ocker, J., Richter, C., Yurchuk, E., Khullar, K., Muller, J., Polakowski, P., Grimley, E. D., LeBeau, J. M., Flachowsky, S., Jansen, S., Kolodinski, S., van Bentum, R., Kersch, A., Kunneth, C., Mikolajick, T.
Published in 2016 46th European Solid-State Device Research Conference (ESSDERC) (01.09.2016)