On-Chip Adaptive VDD Scaled Architecture of Reliable SRAM Cell With Improved Soft Error Tolerance
Gupta, Neha, Shah, Ambika Prasad, Kumar, Rana Sagar, Gupta, Tanisha, Khan, Sajid, Vishvakarma, Santosh Kumar
Published in IEEE transactions on device and materials reliability (01.12.2020)
Published in IEEE transactions on device and materials reliability (01.12.2020)
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