Comparison of the performance of the next generation of optical interferometers
Pisani, Marco, Yacoot, Andrew, Balling, Petr, Bancone, Nicola, Birlikseven, Cengiz, Çelik, Mehmet, Flügge, Jens, Hamid, Ramiz, Köchert, Paul, Kren, Petr, Kuetgens, Ulrich, Lassila, Antti, Picotto, Gian Bartolo, ahin, Ersoy, Seppä, Jeremias, Tedaldi, Matthew, Weichert, Christoph
Published in Metrologia (01.08.2012)
Published in Metrologia (01.08.2012)
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Journal Article
Current State of Avogadro ^Si sphere S8
Nicolaus, R. A., Bartl, G., Bettin, H., Borys, M., Firlus, M., Busch, I., Felgner, A., Kruger-Sehm, R., Krumrey, M., Krystek, M., Kuetgens, U.
Published in IEEE transactions on instrumentation and measurement (01.06.2013)
Published in IEEE transactions on instrumentation and measurement (01.06.2013)
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Journal Article
Measurement of the Silicon Lattice Parameter by Scanning Single Photon X-Ray Interferometry
Kuetgens, Ulrich, Andreas, Birk, Friedrich, Kathrin, Weichert, Christoph, Kochert, Paul, Flugge, Jens
Published in 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) (01.07.2018)
Published in 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) (01.07.2018)
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Conference Proceeding
Calibration of a silicon crystal for absolute nuclear spectroscopy
Massa, Enrico, Mana, Giovanni, Kuetgens, Ulrich, Ferroglio, Luca
Published in Journal of applied crystallography (01.04.2010)
Published in Journal of applied crystallography (01.04.2010)
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Journal Article
Fast and easy Bragg reflex search for Berg-Barrett topography of misoriented crystals
Andreas, Birk, Kuetgens, Ulrich, Becker, Peter
Published in Journal of applied crystallography (01.08.2008)
Published in Journal of applied crystallography (01.08.2008)
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Journal Article
A two thickness interferometer for lattice strain investigations
Massa, Enrico, Melis, Claudio, Sasso, Carlo Paolo, Kuetgens, Ulrich, Mana, Giovanni
Published in 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) (01.07.2016)
Published in 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) (01.07.2016)
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Conference Proceeding
Journal Article
Present State of the avogadro constant determination from silicon Crystals with natural isotopic compositions
Fujii, K., Waseda, A., Kuramoto, N., Mizushima, S., Becker, P., Bettin, H., Nicolaus, A., Kuetgens, U., Valkiers, S., Taylor, P., Paul De Bievre, Mana, G., Massa, E., Matyi, R., Kessler, E.G., Hanke, M.
Published in IEEE transactions on instrumentation and measurement (01.04.2005)
Published in IEEE transactions on instrumentation and measurement (01.04.2005)
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Journal Article
A combined scanning tunnelling microscope and x-ray interferometer
Yacoot, Andrew, Kuetgens, Ulrich, Koenders, Ludger, Weimann, Thomas
Published in Measurement science & technology (01.10.2001)
Published in Measurement science & technology (01.10.2001)
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Journal Article
An X-ray BBB Michelson interferometer
Sutter, John P., Ishikawa, Tetsuya, Kuetgens, Ulrich, Materlik, Gerhard, Nishino, Yoshinori, Rostomyan, Armen, Tamasaku, Kenji, Yabashi, Makina
Published in Journal of synchrotron radiation (01.09.2004)
Published in Journal of synchrotron radiation (01.09.2004)
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Journal Article
Initial tests of a new X-ray Michelson interferometer
Sutter, John P., Kuetgens, Ulrich, Materlik, Gerhard, Rostomyan, Armen
Published in Journal of applied crystallography (01.12.2003)
Published in Journal of applied crystallography (01.12.2003)
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Journal Article
About the existing discrepancy in the determinations of the Avogadro constant
Martin, J., Bettin, H., Kuetgens, U., Schiel, D., Becker, P.
Published in IEEE transactions on instrumentation and measurement (01.04.1999)
Published in IEEE transactions on instrumentation and measurement (01.04.1999)
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Journal Article
Finite element analysis of surface-stress effects in the Si lattice-parameter measurement
Sasso, Carlo, Quagliotti, Danilo, Massa, Enrico, Mana, Giovanni, Kuetgens, Ulrich
Year of Publication 19.02.2013
Year of Publication 19.02.2013
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Journal Article
Calibration of standards for precision pitch measurement in the nanometre region by combined scanning tunnelling microscopy and x-ray interferometry
Lin, Wang, Kuetgens, Ulrich, Becker, Peter, Koenders, Ludger, Dacheng, Li, Mang, Cao
Published in Nanotechnology (01.12.1999)
Published in Nanotechnology (01.12.1999)
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Journal Article
Measurement of the \{220\} lattice-plane spacing of a \(^{28}\)Si crystal
Massa, Enrico, Mana, Giovanni, Kuetgens, Ulrich, Ferroglio, Luca
Published in arXiv.org (15.10.2010)
Published in arXiv.org (15.10.2010)
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Paper
Journal Article
Angstrom ruler for high-accuracy pitch measurement
Lin, W, Dacheng, L, Mang, C, Koenders, L, Kuetgens, U, Becker, P
Published in Applied optics (2004) (01.09.2000)
Published in Applied optics (2004) (01.09.2000)
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Journal Article
K-edge X-ray absorption spectra of biomimetic oxovanadium coordination compounds
Weidemann, Carola, Rehder, Dieter, Kuetgens, Ulrich, Hormes, Josef, Vilter, Hans
Published in Chemical physics (01.10.1989)
Published in Chemical physics (01.10.1989)
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Journal Article