Separation of hot-carrier-induced interface trap creation and oxide charge trapping in PMOSFETs studied by hydrogen/deuterium isotope effect
Cheng, K., Lee, J., Lyding, J.W., Young-Kwang Kim, Young-Wug Kim, Kuang Pyuk Suh
Published in IEEE electron device letters (01.04.2001)
Published in IEEE electron device letters (01.04.2001)
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