Fault Simulation and Test Pattern Generation for Cross-gate Defects in FinFET Circuits
Kuan-Ying Chiang, Yu-Hao Ho, Yo-Wei Chen, Cheng-Sheng Pan, Li, James Chien-Mo
Published in 2015 IEEE 24th Asian Test Symposium (ATS) (01.11.2015)
Published in 2015 IEEE 24th Asian Test Symposium (ATS) (01.11.2015)
Get full text
Conference Proceeding
Journal Article
TARGET: Timing-AwaRe Gate Exhaustive Transition ATPG for cell-internal defects
Ang-Feng Lin, Kuan-Yu Liao, Kuan-Ying Chiang, Li, James Chien-Mo
Published in VLSI Design, Automation and Test(VLSI-DAT) (01.04.2015)
Published in VLSI Design, Automation and Test(VLSI-DAT) (01.04.2015)
Get full text
Conference Proceeding