by Kruseman, B., Majhi, A.K., Gronthoud, G., Eichenberger, S.
Published in 2004 International Conferce on Test (2004)

by RODRIGUEZ-MONTANES, R, ARUMI, D, FIGUERAS, J, EICHENBERGER, S, HORA, C, KMSEMAN, B
Published in Electronics letters (11.10.2007)

by ARUMI, D, RODRIGUEZ-MONTANES, R, FIGUERAS, J, EICHENBERGER, S, HORA, C, KRUSEMAN, B, LOUSBERG, M
Published in Electronics letters (01.03.2007)

by Eichenberger, S., Geuzebroek, J., Hora, C., Kruseman, B., Majhi, A.
Published in 2008 IEEE International Test Conference (01.10.2008)

by Kruseman, B., Majhi, A., Hora, C., Eichenberger, S., Meirlevede, J.
Published in 2004 International Conferce on Test (2004)

by Vermeulen, B., Hora, C., Kruseman, B., Marinissen, E.J., van Rijsinge, R.
Published in 2004 International Conferce on Test (2004)

by Heijmen, T., Kruseman, B., van Veen, R., Meijer, M.
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)

by Kruseman, B., van den Oetelaar, S.
Published in International Test Conference, 2003. Proceedings. ITC 2003 (2003)

by Ke Huang, Stratigopoulos, H. G., Mir, S., Hora, C., Yizi Xing, Kruseman, B.
Published in IEEE transactions on instrumentation and measurement (01.10.2012)

by Kruseman, B.
Published in Proceedings IEEE European Test Workshop (2000)

by Rodríguez-Montañés, R, Arumí, D, Figueras, J, Einchenberger, S, Hora, C, Kruseman, B
Published in 2010 15th IEEE European Test Symposium (01.05.2010)

by Arumi, D., Rodriguez-Montanes, Rosa, Figueras, J., Eichenberger, S., Hora, C., Kruseman, B.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.02.2013)

by Heijmen, Tino, Kruseman, Bram
Published in Solid-state electronics (01.11.2005)

by Arumi, D., Rodriguez-Montanes, Rosa, Figueras, J., Eichenberger, S., Hora, C., Kruseman, B.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.12.2011)

by Arumi, D., Rodriguez-Montanes, Rosa, Figueras, J., Eichenberger, S., Hora, C., Kruseman, B.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.12.2011)

by Jing Wang, Walker, D.M., Xiang Lu, Majhi, A., Kruseman, B., Gronthoud, G., Villagra, L.E., van de Wiel, P.J.A., Eichenberger, S.
Published in IEEE design & test of computers (01.05.2007)

by Alpaslan, E., Kruseman, B., Majhi, A. K., Heuvalman, W. M., Dworak, J.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.05.2012)

by Arumi, D, Rodríguez-Montañés, R, Figueras, J, Eichenberger, S, Hora, C, Kruseman, B, Lousberg, M
Published in Electronics letters (01.03.2007)

by Arumi, D, Rodriguez-Montanes, R, Figueras, J, Eichenberger, S, Hora, C, Kruseman, B, Lousberg, M
Published in Electronics letters (01.03.2007)

by Kruseman, B., Tasic, B., Hora, C., Dohmen, J., Hashempour, H., van Beurden, M., Yizi Xing
Published in 2011 IEEE International Test Conference (01.09.2011)