Measurement of 100 nm monodisperse particles by four Accurate methods: Traceability and uncertainty
Mulholland, George W., Duelge, Kaleb J., Hackley, Vincent A., Farkas, Natalia, Kramar, John A., Zachariah, Michael R., Takahata, Keiji, Sakurai, Hiromu, Ehara, Kensei
Published in Aerosol science and technology (03.03.2024)
Published in Aerosol science and technology (03.03.2024)
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Journal Article
Interlaboratory comparison of nanoparticle size measurements between NMIJ and NIST using two different types of dynamic light scattering instruments
Takahashi, Kayori, Kramar, John A, Farkas, Natalia, Takahata, Keiji, Misumi, Ichiko, Sugawara, Kentaro, Gonda, Satoshi, Ehara, Kensei
Published in Metrologia (01.10.2019)
Published in Metrologia (01.10.2019)
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Journal Article
Comparison of electrostatic and photon pressure force references at the nanonewton level
Shaw, Gordon A, Stirling, Julian, Kramar, John, Williams, Paul, Spidell, Matthew, Mirin, Richard
Published in Metrologia (01.04.2019)
Published in Metrologia (01.04.2019)
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Journal Article
Kinematic modeling and calibration of a flexure based hexapod nanopositioner
Shi, Hongliang, Su, Hai-Jun, Dagalakis, Nicholas, Kramar, John A.
Published in Precision engineering (01.01.2013)
Published in Precision engineering (01.01.2013)
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Journal Article
Scanning probe microscope dimensional metrology at NIST
Kramar, John A, Dixson, Ronald, Orji, Ndubuisi G
Published in Measurement science & technology (01.02.2011)
Published in Measurement science & technology (01.02.2011)
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Journal Article
Milligram mass metrology using an electrostatic force balance
Shaw, Gordon A, Stirling, Julian, Kramar, John A, Moses, Alexander, Abbott, Patrick, Steiner, Richard, Koffman, Andrew, Pratt, Jon R, Kubarych, Zeina J
Published in Metrologia (01.10.2016)
Published in Metrologia (01.10.2016)
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Journal Article
Review of SI traceable force metrology for instrumented indentation and atomic force microscopy
Pratt, Jon R, Kramar, John A, Newell, David B, Smith, Douglas T
Published in Measurement science & technology (01.11.2005)
Published in Measurement science & technology (01.11.2005)
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Journal Article
Milligram mass metrology using electrostatics
Shaw, Gordon A., Kramar, John A.
Published in 29th Conference on Precision Electromagnetic Measurements (CPEM 2014) (01.08.2014)
Published in 29th Conference on Precision Electromagnetic Measurements (CPEM 2014) (01.08.2014)
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Conference Proceeding
Traceable Measurements using a Metrology Scanning Electron Microscope
Damazo, Bradley, Vladár, András E., Marie-Rose, Olivier, Kramar, John
Published in Microscopy and microanalysis (01.08.2022)
Published in Microscopy and microanalysis (01.08.2022)
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Journal Article
Progress toward Système International d'Unités traceable force metrology for nanomechanics
Pratt, Jon R., Smith, Douglas T., Newell, David B., Kramar, John A., Whitenton, Eric
Published in Journal of materials research (01.01.2004)
Published in Journal of materials research (01.01.2004)
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Journal Article