Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope
Trager-Cowan, C, Alasmari, A, Avis, W, Bruckbauer, J, Edwards, P R, Ferenczi, G, Hourahine, B, Kotzai, A, Kraeusel, S, Kusch, G, Martin, R W, McDermott, R, Naresh-Kumar, G, Nouf-Allehiani, M, Pascal, E, Thomson, D, Vespucci, S, Smith, M D, Parbrook, P J, Enslin, J, Mehnke, F, Kuhn, C, Wernicke, T, Kneissl, M, Hagedorn, S, Knauer, A, Walde, S, Weyers, M, Coulon, P-M, Shields, P A, Bai, J, Gong, Y, Jiu, L, Zhang, Y, Smith, R M, Wang, T, Winkelmann, A
Published in Semiconductor science and technology (01.05.2020)
Published in Semiconductor science and technology (01.05.2020)
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Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope
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Published in IOP conference series. Materials Science and Engineering (01.07.2020)
Published in IOP conference series. Materials Science and Engineering (01.07.2020)
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Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors
Trager-Cowan, C., Naresh-Kumar, G., Allehiani, N., Kraeusel, S., Hourahine, B., Vespucci, S., Thomson, D., Bruckbauer, J., Kusch, G., Edwards, P. R., Martin, R. W., Mauder, C., Day, A. P., Winkelmann, A., Vilalta-Clemente, A., Wilkinson, A. J., Parbrook, P. J., Kappers, M. J., Moram, M. A., Oliver, R. A., Humphreys, C. J., Shields, P., Le Boulbar, E. D., Maneuski, D., O'Shea, V., Mingard, K. P.
Published in Microscopy and microanalysis (01.08.2014)
Published in Microscopy and microanalysis (01.08.2014)
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Global search for stable screw dislocation cores in III-N semiconductors
Kraeusel, S., Hourahine, B.
Published in Physica status solidi. A, Applications and materials science (01.01.2012)
Published in Physica status solidi. A, Applications and materials science (01.01.2012)
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