Search Results - "Kothiyal, M P" :: K.UTB vyhledávací portál

Use of spatial phase shifting technique in digital speckle pattern interferometry (DSPI) and digital shearography (DS)

by Bhaduri, Basanta, Mohan, N K, Kothiyal, M P, Sirohi, R S
Published in Optics express (27.11.2006)

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$Low-threshold optical power limiting of cw laser illumination based on nonlinear refraction in zinc tetraphenyl porphyrin$

Low-threshold optical power limiting of cw laser illumination based on nonlinear refraction in zinc tetraphenyl porphyrin

by Sendhil, Kaladevi, Vijayan, C., Kothiyal, M.P.
Published in Optics and laser technology (01.10.2006)

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Microscopic TV shearography for characterization of microsystems

by Paul Kumar, U, Kothiyal, M P, Mohan, N Krishna
Published in Optics letters (15.05.2009)

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Design of a low power optical limiter based on a new nanocomposite material incorporating silica-encapsulated phthalocyanine in Nafion

by Sathiyamoorthy, K, Vijayan, C, Kothiyal, M P
Published in Journal of physics. D, Applied physics (07.10.2007)

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Nonlinear optical properties of a porphyrin derivative incorporated in Nafion polymer

by Sendhil, Kaladevi, Vijayan, C., Kothiyal, M.P.
Published in Optical materials (01.09.2005)

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Characterization of surface topography by confocal microscopy: I. Principles and the measurement system

by Udupa, Ganesha, Singaperumal, M, Sirohi, R S, Kothiyal, M P
Published in Measurement science & technology (01.03.2000)

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Digital speckle pattern interferometry using spatial phase shifting: influence of intensity and phase gradients

by Bhaduri, Basanta, Mohan, N. Krishna, Kothiyal, M.P.
Published in Journal of modern optics (20.03.2008)

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Microscopic TV holography for MEMS deflection and 3-D surface profile characterization

by Paul Kumar, U., Bhaduri, Basanta, Krishna Mohan, N., Kothiyal, M.P., Asundi, A.K.
Published in Optics and lasers in engineering (01.09.2008)

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Curvature measurement using three-aperture digital shearography and fast Fourier transform

by Bhaduri, Basanta, Kothiyal, M.P., Krishna Mohan, N.
Published in Optics and lasers in engineering (01.10.2007)

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A dual-function ESPI system for the measurement of out-of-plane displacement and slope

by Bhaduri, B., Mohan, N.K., Kothiyal, M.P.
Published in Optics and lasers in engineering (01.06.2006)

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Spatial phase filtering with a porphyrin derivative as phase filter in an optical image processor

by Sendhil, Kaladevi, Vijayan, C., Kothiyal, M.P.
Published in Optics communications (15.07.2005)

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White light interferometry for surface profiling with a colour CCD

by Kumar, U. Paul, Haifeng, Wang, Mohan, N. Krishna, Kothiyal, M.P.
Published in Optics and lasers in engineering (01.08.2012)

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$Contrast reversal and enhancement of phase spot array/grid with an intensity-dependent refractive index medium as phase filter$

Contrast reversal and enhancement of phase spot array/grid with an intensity-dependent refractive index medium as phase filter

by Sendhil, Kaladevi, Vijayan, C., Kothiyal, M.P.
Published in Optics and lasers in engineering (01.02.2006)

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Two-wavelength micro-interferometry for 3-D surface profiling

by Kumar, U. Paul, Bhaduri, Basanta, Kothiyal, M.P., Mohan, N. Krishna
Published in Optics and lasers in engineering (01.02.2009)

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Characterization of surface topography by confocal microscopy: II. The micro and macro surface irregularities

by Udupa, Ganesha, Singaperumal, M, Sirohi, R S, Kothiyal, M P
Published in Measurement science & technology (01.03.2000)

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Low power optical limiting in ClAl-Phthalocyanine due to self defocusing and self phase modulation effects

by Sathiyamoorthy, K., Vijayan, C., Kothiyal, M.P.
Published in Optical materials (01.09.2008)

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Single frame digital fringe projection profilometry for 3-D surface shape measurement

by Paul Kumar, U., Somasundaram, U., Kothiyal, M.P., Krishna Mohan, N.
Published in Optik (Stuttgart) (01.01.2013)

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Measurement of static and vibrating microsystems using microscopicTV holography

by Paul Kumar, U., Krishna Mohan, N., Kothiyal, M.P.
Published in Optik (Stuttgart) (2011)

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Phase shifting by a rotating polarizer in white-light interferometry for surface profiling

by Helen, S. Suja, Kothiyal, M. P., Sirohi, R. S.
Published in Journal of modern optics (01.05.1999)

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Achromatic phase shifting by a rotating polarizer

by Helen, S.Suja, Kothiyal, M.P., Sirohi, R.S.
Published in Optics communications (15.09.1998)

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