Dependence of Voltage and Size on Write Error Rates in Spin-Transfer Torque Magnetic Random-Access Memory
Nowak, Janusz J., Robertazzi, Ray P., Sun, Jonathan Z., Hu, Guohan, Park, Jeong-Heon, Lee, JungHyuk, Annunziata, Anthony J., Lauer, Gen P., Kothandaraman, Raman, O'Sullivan, Eugene J., Trouilloud, Philip L., Kim, Younghyun, Worledge, Daniel C.
Published in IEEE magnetics letters (2016)
Published in IEEE magnetics letters (2016)
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Journal Article
Etching Methods for STT-MRAM
O'Sullivan, E. J., Annunziata, Anthony J, Gonsalves, Jemima, Hu, G., Joseph, Eric A, Kothandaraman, Raman, Lauer, Gen, Marchack, Nathan, Nowak, J. J., Robertazzi, R. P., Sun, J. Z., Suwannasiri, Thitima, Trouilloud, P. L., Zhu, Yu, Worledge, D. C.
Published in Meeting abstracts (Electrochemical Society) (01.09.2017)
Published in Meeting abstracts (Electrochemical Society) (01.09.2017)
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Journal Article