Search Results - "Kotaro, Hosoya" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

Electron Irradiation Cleaning of the SEM and its Samples

Electron Irradiation Cleaning of the SEM and its Samples

by Vladar, Andras, Hoyle, David, Kotaro, Hosoya
Published in Microscopy and microanalysis (01.08.2021)

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Journal Article

Development of Dark-Field Photonic Scanning Transmission Electron Microscopy (DFP-STEM)

Development of Dark-Field Photonic Scanning Transmission Electron Microscopy (DFP-STEM)

by Muto, Atsushi, Dan, Yukari, Hosoya, Kotaro
Published in Microscopy and microanalysis (01.08.2020)

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Journal Article

Development of STEM Imaging in SEM Using Photon Detector

Development of STEM Imaging in SEM Using Photon Detector

by Hosoya, Kotaro, Dan, Yukari, Muto, Atsushi
Published in Microscopy and microanalysis (01.08.2019)

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Journal Article

In situ Comparative heating and simultaneous multi-detector imaging at high and ultra-low landing energies

In situ Comparative heating and simultaneous multi-detector imaging at high and ultra-low landing energies

by Muto, Atsushi, Dogel, Stas, Hosoya, Kotaro, Hosseinkhannazer, Hooman, Mahdi, Najia, Postek, Michael T
Published in Microscopy and microanalysis (01.08.2021)

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Journal Article

High Spatial Resolution and Wide Range EDS Analysis with FE-SEM

High Spatial Resolution and Wide Range EDS Analysis with FE-SEM

by Takeuchi, Shuichi, Hashimoto, Yoichiro, Sasajima, Masahiro, Hosoya, Kotaro, Dan, Yukari, Miyasaka, Shintaro, Yamaguchi, Susumu
Published in Microscopy and microanalysis (01.07.2017)

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Journal Article

Holder and charged particle beam apparatus

Holder and charged particle beam apparatus

by Hosoya, Kotaro
Year of Publication 02.03.2021

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Patent

HOLDER AND CHARGED PARTICLE BEAM APPARATUS

HOLDER AND CHARGED PARTICLE BEAM APPARATUS

by HOSOYA, Kotaro
Year of Publication 26.11.2020

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Patent

HOLDER AND CHARGED PARTICLE BEAM APPARATUS

HOLDER AND CHARGED PARTICLE BEAM APPARATUS

by HOSOYA, Kotaro
Year of Publication 24.09.2020

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Patent

Holder and charged particle beam apparatus

Holder and charged particle beam apparatus

by Hosoya, Kotaro
Year of Publication 15.09.2020

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Patent

Charged Particle Beam Apparatus and Cleaning Method

Charged Particle Beam Apparatus and Cleaning Method

by HOSOYA, Kotaro, MORIKAWA, Akinari
Year of Publication 22.12.2022

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Patent

Charged particle beam apparatus and cleaning method

Charged particle beam apparatus and cleaning method

by Morikawa, Akinari, Hosoya, Kotaro
Year of Publication 04.10.2022

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Patent

Charged Particle Beam Apparatus and Cleaning Method

Charged Particle Beam Apparatus and Cleaning Method

by HOSOYA, Kotaro, MORIKAWA, Akinari
Year of Publication 02.07.2020

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Patent

Holder and charged particle beam device

Holder and charged particle beam device

by HOSOYA KOTARO
Year of Publication 20.04.2021

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Patent

STRAHLVORRICHTUNG FÜR GELADENE TEILCHEN UND REINIGUNGSVERFAHREN

STRAHLVORRICHTUNG FÜR GELADENE TEILCHEN UND REINIGUNGSVERFAHREN

by Morikawa, Akinari, Hosoya, Kotaro
Year of Publication 08.12.2022

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Patent

CHARGED-PARTICLE BEAM DEVICE AND CLEANING METHOD

CHARGED-PARTICLE BEAM DEVICE AND CLEANING METHOD

by MORIKAWA AKINARI, HOSOYA KOTARO
Year of Publication 17.04.2020

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Patent

STRAHLVORRICHTUNG FÜR GELADENE TEILCHEN UND REINIGUNGSVERFAHREN

STRAHLVORRICHTUNG FÜR GELADENE TEILCHEN UND REINIGUNGSVERFAHREN

by Morikawa, Akinari, Hosoya, Kotaro
Year of Publication 13.02.2020

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Patent

SCANNING ELECTRON MICROSCOPE AND SECONDARY ELECTRON DETECTION METHOD

SCANNING ELECTRON MICROSCOPE AND SECONDARY ELECTRON DETECTION METHOD

by TAKAHOKO YOSHIHIRO, HOSOYA KOTARO
Year of Publication 17.06.2013

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Patent

Sample holder for an electron microscope

Sample holder for an electron microscope

by HOSOYA KOTARO, TAKAHOKO YOSHIHIRO
Year of Publication 11.06.2013

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Patent

Sample holder for an electron microscope

Sample holder for an electron microscope

by HOSOYA KOTARO, TAKAHOKO YOSHIHIRO
Year of Publication 02.04.2013

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Patent

Charged particle beam device and charged particle beam device control method

Charged particle beam device and charged particle beam device control method

by Hosoya Kotaro, Saitou Tsutomu, Aoki Kenji, Nakamura Mitsuhiro, Shigeto Kunji
Year of Publication 30.01.2018

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Patent