Thermoelectric microscopy of magnetic skyrmions
Iguchi, Ryo, Kasai, Shinya, Koshikawa, Kazushige, Chinone, Norimichi, Suzuki, Shinsuke, Uchida, Ken-ichi
Published in Scientific reports (05.12.2019)
Published in Scientific reports (05.12.2019)
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Journal Article
Thermal behavior analysis of interconnect structures of Si semiconductor devices using the temperature dependent reflectance of an incoherent light beam
Endo, Koichi, Midoh, Yoshihiro, Nakamura, Tomonori, Matsumoto, Toru, Koshikawa, Kazushige, Nakamae, Koji
Published in Japanese Journal of Applied Physics (01.07.2018)
Published in Japanese Journal of Applied Physics (01.07.2018)
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Journal Article
Direct photo emission monitoring for analysis of IGBT destruction mechanism using streak camera
Matsudai, Tomoko, Endo, Koichi, Ogura, Tsuneo, Matsumoto, Toru, Uchiyama, Koro, Niikura, Fuminori, Koshikawa, Kazushige
Published in 2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD) (01.05.2017)
Published in 2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD) (01.05.2017)
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Conference Proceeding
Direct photo emission monitoring for high power IGBT during avalanche operation
Matsudai, Tomoko, Endo, Koichi, Ogura, Tsuneo, Matsumoto, Toru, Uchiyama, Koro, Koshikawa, Kazushige
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
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Conference Proceeding
Enhancement of localization capability of lock-in thermography for power semiconductor devices by searching high-emissivity films
Chinone, Norimichi, Matsumoto, Toru, Koshikawa, Kazushige
Published in 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2019)
Published in 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2019)
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Conference Proceeding