Tackling long duration transients in sequential logic
Koser, Erol, Stechele, Walter
Published in 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) (01.07.2016)
Published in 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) (01.07.2016)
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Conference Proceeding
Integrated Soft Error Resilience and Self-Test
Koser, Erol, Krosche, Sebastian, Stechele, Walter
Published in 2016 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) (01.09.2016)
Published in 2016 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) (01.09.2016)
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Conference Proceeding
Matching Detection and Correction Schemes for Soft Error Handling in Sequential Logic
Koser, Erol, Miller, Felix, Stechele, Walter
Published in 2015 Euromicro Conference on Digital System Design (01.08.2015)
Published in 2015 Euromicro Conference on Digital System Design (01.08.2015)
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Conference Proceeding
A Long Duration Transient Resilient Pipeline Scheme
Koser, Erol, Stechele, Walter
Published in IEEE transactions on device and materials reliability (01.03.2017)
Published in IEEE transactions on device and materials reliability (01.03.2017)
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Magazine Article