Microwave performance of GaAs MOSFET with wet thermally oxidized InAlP gate dielectric
Cao, Y., Li, X., Zhang, J., Fay, P., Kosel, T.H., Hall, D.C.
Published in IEEE electron device letters (01.05.2006)
Published in IEEE electron device letters (01.05.2006)
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Journal Article
A combined chemical vapor deposition and rapid thermal diffusion process for SiGe Esaki diodes by ultra-shallow junction formation
Wernersson, L.-E., Kabeer, S., Zela, V., Lind, E., Zhang, J., Seifert, W., Kosel, T.H., Seabaugh, A.
Published in IEEE transactions on nanotechnology (01.09.2005)
Published in IEEE transactions on nanotechnology (01.09.2005)
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Journal Article
Performance of Sub-micron Gate Length InAlP Native Oxide GaAs-channel MOSFETs
Zhang, J., Kosel, T.H., Hall, D.C., Fay, P.
Published in 2007 65th Annual Device Research Conference (01.06.2007)
Published in 2007 65th Annual Device Research Conference (01.06.2007)
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Conference Proceeding
CuPt-Type Ordering of MOCVD In 0.49 Al 0.51 P
Kosel, T.H., Hall, D.C., Dupuis, R.D., Heller, R.D., Cook, R.E.
Published in Microscopy and microanalysis (01.08.2002)
Published in Microscopy and microanalysis (01.08.2002)
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Journal Article
Microwave-Frequency InAlP-oxide/GaAs MOSFETs
Cao, Y., Zhang, J., Kosel, T.H., Hall, D.C., Fay, P.
Published in 2006 IEEE Compound Semiconductor Integrated Circuit Symposium (01.11.2006)
Published in 2006 IEEE Compound Semiconductor Integrated Circuit Symposium (01.11.2006)
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Conference Proceeding
CuPt-Type Ordering of MOCVD In0.49Al0.51P
Kosel, T.H., Hall, D.C., Dupuis, R.D., Heller, R.D., Cook, R.E.
Published in Microscopy and microanalysis (01.08.2002)
Published in Microscopy and microanalysis (01.08.2002)
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Journal Article