Microfocus-infrared synchrotron ellipsometer for mapping of ultra thin films
Gensch, M., Korte, E.H., Esser, N., Schade, U., Hinrichs, K.
Published in Infrared physics & technology (01.09.2006)
Published in Infrared physics & technology (01.09.2006)
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Conference Proceeding
Measured characteristics of infrared edge radiation from BESSY II
Schade, U., Röseler, A., Korte, E.H., Scheer, M., Peatman, W.B.
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (01.12.2000)
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (01.12.2000)
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IR spectroscopic ellipsometry: transmission studies on liquid crystals
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Conference Proceeding
IR specular reflectance studies on rough-surfaced solids and on layered systems with nonuniform interfaces: Optical simulations
Hopfe, V., Korte, E.H., Klobes, P., Grählert, W.
Published in Journal of molecular structure (01.03.1993)
Published in Journal of molecular structure (01.03.1993)
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Conference Proceeding
Application of gas chromatography-cryocondensation-Fourier transform infrared spectroscopy and gas chromatography-mass spectrometry to the identification of gas phase reaction products from the alpha-pinene / ozone reaction
Schrader, W, Geiger, J, Hoffmann, T, Klockow, D, Korte, E.H
Published in Journal of chromatography. A (1999)
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Published in Journal of chromatography. A (1999)
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