Advanced microprocessor test strategy and methodology
HUOTT, W. V, KOPROWSKI, T. J, ROBBINS, B. J, KUSKO, M. P, PATERAS, S. V, HOFFMAN, D. E, MCNAMARA, T. G, SNETHEN, T. J
Published in IBM journal of research and development (01.07.1997)
Published in IBM journal of research and development (01.07.1997)
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Journal Article
Testing the 400 MHz IBM generation-4 CMOS chip
Foote, T.G., Hoffman, D.E., Huott, W.V., Koprowski, T.J., Robbins, B.J., Kusko, M.P.
Published in Proceedings - International Test Conference (1997)
Published in Proceedings - International Test Conference (1997)
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Conference Proceeding
Journal Article
Testing the 500-MHz IBM S/390 microprocessor
Foote, T.G., Hoffman, D.E., Huott, W.V., Koprowski, T.J., Kusko, M.P., Robbins, B.J.
Published in IEEE design & test of computers (01.07.1998)
Published in IEEE design & test of computers (01.07.1998)
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Journal Article