Influence of moisture on the ferroelectric properties of sputtered hafnium oxide thin films
Berg, Fenja, Kopperberg, Nils, Lübben, Jan, Valov, Ilia, Wu, Xiaochao, Simon, Ulrich, Böttger, Ulrich
Published in Journal of applied physics (14.11.2023)
Published in Journal of applied physics (14.11.2023)
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Journal Article
Endurance of 2 Mbit Based BEOL Integrated ReRAM
Kopperberg, Nils, Wiefels, Stefan, Hofmann, Karl, Otterstedt, Jan, Wouters, Dirk J., Waser, Rainer, Menzel, Stephan
Published in IEEE access (2022)
Published in IEEE access (2022)
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Journal Article
HRS Instability in Oxide-Based Bipolar Resistive Switching Cells
Wiefels, Stefan, Bengel, Christopher, Kopperberg, Nils, Zhang, Kaihua, Waser, Rainer, Menzel, Stephan
Published in IEEE transactions on electron devices (01.10.2020)
Published in IEEE transactions on electron devices (01.10.2020)
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Journal Article
Reliability Aspects of 28 nm BEOL‐Integrated Resistive Switching Random Access Memory
Wiefels, Stefan, Kopperberg, Nils, Hofmann, Karl, Otterstedt, Jan, Wouters, Dirk, Waser, Rainer, Menzel, Stephan
Published in Physica status solidi. A, Applications and materials science (03.11.2023)
Published in Physica status solidi. A, Applications and materials science (03.11.2023)
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Journal Article
RESET Kinetics of 28 nm Integrated ReRAM
Wiefels, Stefan, Kopperberg, Nils, Hofmann, Karl, Otterstedt, Jan, Wouters, Dirk, Waser, Rainer, Menzel, Stephan
Published in 2023 IEEE International Integrated Reliability Workshop (IIRW) (08.10.2023)
Published in 2023 IEEE International Integrated Reliability Workshop (IIRW) (08.10.2023)
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Conference Proceeding
Reliability effects of lateral filament confinement by nano-scaling the oxide in memristive devices
Stasner, Pascal, Kopperberg, Nils, Schnieders, Kristoffer, Hennen, Tyler, Wiefels, Stefan, Menzel, Stephan, Waser, Rainer, Wouters, Dirk J
Published in Nanoscale horizons (29.04.2024)
Published in Nanoscale horizons (29.04.2024)
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Journal Article
NEUROTEC I: Neuro-inspired Artificial Intelligence Technologies for the Electronics of the Future
Galicia, Melvin, Menzel, Stephan, Merchant, Farhad, Muller, Maximilian, Chen, Hsin-Yu, Zhao, Qing-Tai, Cuppers, Felix, Jalil, Abdur R., Shu, Qi, Schuffelgen, Peter, Mussler, Gregor, Funck, Carsten, Lanius, Christian, Wiefels, Stefan, von Witzleben, Moritz, Bengel, Christopher, Kopperberg, Nils, Ziegler, Tobias, Ahmad, R. Walied, Kruger, Alexander, Pohls, Leticia, Dittmann, Regina, Hoffmann-Eifert, Susanne, Rana, Vikas, Grutzmacher, Detlev, Wuttig, Matthias, Wouters, Dirk, Vescan, Andrei, Gemmeke, Tobias, Knoch, Joachim, Lemme, Max, Leupers, Rainer, Waser, Rainer
Published in 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) (14.03.2022)
Published in 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) (14.03.2022)
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Conference Proceeding