Phase-Change Characteristics and Crystal Structure in Multi Stacked GeTe/InTe Films
Kim, Ki-Hong, Lee, Jun-Ho, Kyoung, Yong-Koo
Published in Japanese Journal of Applied Physics (01.10.2011)
Published in Japanese Journal of Applied Physics (01.10.2011)
Get full text
Journal Article
Degradation by water vapor of hydrogenated amorphous silicon oxynitride films grown at low temperature
Lee, Hyung-Ik, Park, Jong-Bong, Xianyu, Wenxu, Kim, Kihong, Chung, Jae Gwan, Kyoung, Yong Koo, Byun, Sunjung, Yang, Woo Young, Park, Yong Young, Kim, Seong Min, Cho, Eunae, Shin, Jai Kwang
Published in Scientific reports (26.10.2017)
Published in Scientific reports (26.10.2017)
Get full text
Journal Article
Damage-free and atomically precise surface preparation of SrTiO3
Kim, Yong Su, Yun, Dong Jin, Kim, Seong Heon, Kyoung, Yong Koo, Heo, Sung
Published in Current applied physics (01.11.2016)
Published in Current applied physics (01.11.2016)
Get full text
Journal Article
Damage-Free Photoemission Study of Conducting Carbon Composite Electrode Using Ar Gas Cluster Ion Beam Sputtering Process
Yun, Dong-Jin, Jung, Changhoon, Lee, Hyung-Ik, Kim, Ki-Hong, Kyoung, Yong Koo, Benayad, Anass, Chung, JaeGwan
Published in Journal of the Electrochemical Society (01.01.2012)
Published in Journal of the Electrochemical Society (01.01.2012)
Get full text
Journal Article
Origin of positive Vth shift and mobility effects in amorphous GaInZnO thin films
Heo, Sung, Lee, Dongwha, Kyoung, Yong Koo, Kwon, Young-Nam, Kim, KiHong, Chung, JaeGwan, Lee, Jae Cheol, Park, Gyeong Su, Oh, Jong Soo, Tahir, Dahlang, Kang, Hee Jae, Cho, Hoon Young
Published in Thin solid films (01.10.2016)
Published in Thin solid films (01.10.2016)
Get full text
Journal Article
Effect of nitrogen on structural stability of bismuth doped GeTe films under thermal treatment
Kim, Ki-Hong, Lee, Jun-Ho, Kyoung, Yong-Koo, Choi, Sang-Jun
Published in Thin solid films (01.12.2012)
Published in Thin solid films (01.12.2012)
Get full text
Journal Article
Direct evidence of flat band voltage shift for TiN/LaO or ZrO/SiO2 stack structure via work function depth profiling
Heo, Sung, Park, Hyoungsun, Ko, Dong-Su, Kim, Yong Su, Kyoung, Yong Koo, Lee, Hyung-Ik, Cho, Eunae, Lee, Hyo Sug, Park, Gyung-Su, Shin, Jai Kwang, Lee, Dongjin, Lee, Jieun, Jung, Kyoungho, Jeong, Moonyoung, Yamada, Satoru, Kang, Hee Jae, Choi, Byoung-Deog
Published in Scientific reports (02.03.2017)
Published in Scientific reports (02.03.2017)
Get full text
Journal Article
Damage profiles of Si (001) surface via Ar cluster beam sputtering
Kyoung, Yong Koo, Lee, Hyung Ik, Chung, Jae Gwan, Heo, Sung, Lee, Jae Cheol, Cho, Young Joon, Kang, Hee Jae
Published in Surface and interface analysis (01.01.2013)
Published in Surface and interface analysis (01.01.2013)
Get full text
Journal Article
Conference Proceeding
Topography and field effects in the inner side of microvia hole using ToF-SIMS
Lee, Jae Cheol, Kyoung, Yong Koo, Song, In Yong, Lee, Jae Woo, Shin, Young Sik, Kim, Jin Seok, Iida, Shin-ichi
Published in Surface and interface analysis (01.07.2014)
Published in Surface and interface analysis (01.07.2014)
Get full text
Journal Article
Phase-Change Characteristics and Crystal Structure in Multi Stacked GeTe/InTe Films
Kim, Ki-Hong, Lee, Jun-Ho, Kyoung, Yong-Koo
Published in Japanese Journal of Applied Physics (01.10.2011)
Published in Japanese Journal of Applied Physics (01.10.2011)
Get full text
Journal Article
Protective Oxide Coating for Ionic Conductive Solid Electrolyte Interphase
Kim, Yong Su, Kim, Seong Heon, Kim, Gyusung, Heo, Sung, Mun, Jinsoo, Han, Sungsoo, Jung, Heechul, Kyoung, Yong Koo, Yun, Dong Jin, Baek, Woon Joong, Doo, Seokgwang
Published in ACS applied materials & interfaces (16.11.2016)
Published in ACS applied materials & interfaces (16.11.2016)
Get full text
Journal Article
Structural and compositional evolution of carbon-doped Ge2Sb2Te5 film under different annealing conditions
Kim, Ki-Hong, Kyoung, Yong-Koo, Yun, Dong-Jin, Choi, Sang-Jun
Published in Thin solid films (02.12.2013)
Published in Thin solid films (02.12.2013)
Get full text
Journal Article
Long-Term Structural Instabilities in Undoped and Nitrogen-Doped Ge2Sb2Te5 Films
Kim, Ki-Hong, Yun, Dong-Jin, Kyoung, Yong-Koo, Yu, Da-Eun, Choi, Sang-Jun
Published in Journal of electronic materials (01.09.2014)
Published in Journal of electronic materials (01.09.2014)
Get full text
Journal Article
Long-Term Structural Instabilities in Undoped and Nitrogen-Doped Ge^sub 2^Sb^sub 2^Te^sub 5^ Films
Kim, Ki-hong, Yun, Dong-jin, Kyoung, Yong-koo, Yu, Da-eun, Choi, Sang-jun
Published in Journal of electronic materials (01.09.2014)
Published in Journal of electronic materials (01.09.2014)
Get full text
Journal Article
Defect states in amorphous SiNx:H compounds using thermally stimulated exo-electron emission
Heo, Sung, Park, Hyoungsun, chung, JaeGwan, Lee, Hyung Ik, Park, Jucheol, Kyoung, Yong Koo, Kim, Yong Su, Kim, KiHong, Byun, SunJung, Jeon, Woo Sung, Park, Gyeong Su, Choi, Pyungho, Choi, Byoung-Deog, Lee, Dongwha, Cho, Hoon Young, Kang, Hee Jae
Published in Thin solid films (01.10.2016)
Published in Thin solid films (01.10.2016)
Get full text
Journal Article
Direct evidence of flat band voltage shift for TiN/LaO or ZrO/SiO 2 stack structure via work function depth profiling
Heo, Sung, Park, Hyoungsun, Ko, Dong-Su, Kim, Yong Su, Kyoung, Yong Koo, Lee, Hyung-Ik, Cho, Eunae, Lee, Hyo Sug, Park, Gyung-Su, Shin, Jai Kwang, Lee, Dongjin, Lee, Jieun, Jung, Kyoungho, Jeong, Moonyoung, Yamada, Satoru, Kang, Hee Jae, Choi, Byoung-Deog
Published in Scientific reports (02.03.2017)
Published in Scientific reports (02.03.2017)
Get full text
Journal Article