In-Lens Band-Pass Filter for Secondary Electrons in Ultrahigh Resolution SEM
Konvalina, Ivo, Mika, Filip, Krátký, Stanislav, Materna Mikmeková, Eliška, Müllerová, Ilona
Published in Materials (19.07.2019)
Published in Materials (19.07.2019)
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Journal Article
Making Sense of Complex Carbon and Metal/Carbon Systems by Secondary Electron Hyperspectral Imaging
Abrams, Kerry J., Dapor, Maurizio, Stehling, Nicola, Azzolini, Martina, Kyle, Stephan J., Schäfer, Jan, Quade, Antje, Mika, Filip, Kratky, Stanislav, Pokorna, Zuzana, Konvalina, Ivo, Mehta, Danielle, Black, Kate, Rodenburg, Cornelia
Published in Advanced science (01.10.2019)
Published in Advanced science (01.10.2019)
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Journal Article
Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer
Konvalina, Ivo, Daniel, Benjamin, Zouhar, Martin, Paták, Aleš, Müllerová, Ilona, Frank, Luděk, Piňos, Jakub, Průcha, Lukáš, Radlička, Tomáš, Werner, Wolfgang S M, Mikmeková, Eliška Materna
Published in Nanomaterials (Basel, Switzerland) (18.09.2021)
Published in Nanomaterials (Basel, Switzerland) (18.09.2021)
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Journal Article
Quantification of STEM Images in High Resolution SEM for Segmented and Pixelated Detectors
Konvalina, Ivo, Paták, Aleš, Zouhar, Martin, Müllerová, Ilona, Fořt, Tomáš, Unčovský, Marek, Materna Mikmeková, Eliška
Published in Nanomaterials (Basel, Switzerland) (28.12.2021)
Published in Nanomaterials (Basel, Switzerland) (28.12.2021)
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Journal Article
Methods of the electron induced cleanning in SEM
Müllerová, Ilona, Konvalina, Ivo, Materna Mikmeková, Eliška
Published in Microscopy and microanalysis (01.08.2021)
Published in Microscopy and microanalysis (01.08.2021)
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Journal Article
A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning
Materna Mikmeková, Eliška, Materna, Jiří, Konvalina, Ivo, Mikmeková, Šárka, Müllerová, Ilona, Asefa, Tewodros
Published in Ultramicroscopy (01.08.2024)
Published in Ultramicroscopy (01.08.2024)
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Journal Article
Study of Graphene by Scanning Low Energy Electron Microscopy and Time-of-Flight Spectroscopy
Müllerová, Ilona, Konvalina, Ivo, Zouhar, Martin, Paták, Aleš, Daniel, Benjamin, Pru Cha, Lukáš, Piňos, Jakub, Materna Mikmeková, Eliška
Published in Microscopy and microanalysis (22.07.2023)
Published in Microscopy and microanalysis (22.07.2023)
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Journal Article
Study of Graphene and Thin Foils by a Time-of-Flight Spectrometer for Low Landing Energies
Konvalina, Ivo, Daniel, Benjamin, Zouhar, Martin, Paták, Aleš, Průcha, Lukáš, Piňos, Jakub, Müllerová, Ilona, Materna Mikmeková, Eliška
Published in Microscopy and microanalysis (01.08.2022)
Published in Microscopy and microanalysis (01.08.2022)
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Journal Article
The time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements
Konvalina, Ivo, Zouhar, Martin, Daniel, Benjamin, Paták, Aleš, Piňos, Jakub, Frank, Luděk, Müllerová, Ilona, Mikmeková, Eliška Materna
Published in Microscopy and microanalysis (01.08.2021)
Published in Microscopy and microanalysis (01.08.2021)
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Journal Article
Very Low Energy Electron Transmission Spectroscopy of 2D Materials
Konvalina, Ivo, Daniel, Benjamin, Zouhar, Martin, Paták, Aleš, Piňos, Jakub, Radlička, Tomáš, Frank, Luděk, Müllerová, Ilona, Materna-Mikmeková, Eliška
Published in Microscopy and microanalysis (01.08.2020)
Published in Microscopy and microanalysis (01.08.2020)
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Journal Article
Studying 2D Materials by Means of Microscopy and Spectroscopy with Low Energy Electrons
Konvalina, Ivo, Daniel, Benjamin, Zouhar, Martin, Piňos, Jakub, Radlička, Tomáš, Frank, Luděk, Müllerová, Ilona, Materna Mikmeková, Eliška
Published in Microscopy and microanalysis (01.08.2019)
Published in Microscopy and microanalysis (01.08.2019)
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Journal Article
Low and Ultra-low Energy Scanning Electron Microscopy of 2D Transition Metal Dichalcogenides: Experiments and Simulations
Mikmekovâ, Eliska, Patâk, Ales, Mullerovâ, Ilona, Frank, Ludëk, Daniel, Benjamin, Konvalina, Ivo, Rihâcek, Tomâs, Zouhar, Martin, Zaporozchenko, Anna, Lejeune, Michael
Published in Microscopy and microanalysis (01.08.2018)
Published in Microscopy and microanalysis (01.08.2018)
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Journal Article
Practical Use of Scanning Low Energy Electron Microscope (SLEEM)
Müllerová, Ilona, Mikmeková, Eliška, Mikmeková, Šárka, Konvalina, Ivo, Frank, Luděk
Published in Microscopy and microanalysis (01.07.2016)
Published in Microscopy and microanalysis (01.07.2016)
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