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EDS Analysis at Low Beam Currents Facilitated by a Large Area Silicon Drift Detector
by
McCarthy, Jon J.
,
Konopka
,
John F
.
Published in
Microscopy and microanalysis
(01.08.2018)
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Very Large Area EDS Spectral Images: Impact of Latest Silicon Drift Detector Technology
by
McCarthy, Jon J.
,
Konopka
,
John F
.
Published in
Microscopy and microanalysis
(01.08.2018)
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solid-state x-ray spectrometry at 50 years
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