Effect of Hevea brasiliensis seed meal or Euphorbia heterophylla seed supplemented diets on performance, physicochemical and sensory properties of eggs, and egg yolk fatty acid profile in guinea fowl (Numida meleagris)
Kouassi, G.F., Koné, G.A., Good, M., Assidjo, N.E., Kouba, M.
Published in Poultry science (01.01.2020)
Published in Poultry science (01.01.2020)
Get full text
Journal Article
Factors Impacting Guinea Fowl (Numida meleagris) Production in Ivory Coast
Kouassi, G.F., Koné, G.A., Good, M., Kouba, M.
Published in Journal of applied poultry research (01.12.2019)
Published in Journal of applied poultry research (01.12.2019)
Get full text
Journal Article
Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses
Koné, G.A., Grandchamp, B., Hainaut, C., Marc, F., Maneux, C., Labat, N., Zimmer, T., Nodjiadjim, V., Riet, M., Godin, J.
Published in Microelectronics and reliability (01.09.2011)
Published in Microelectronics and reliability (01.09.2011)
Get full text
Journal Article
Conference Proceeding
Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design
Ghosh, S., Grandchamp, B., Koné, G.A., Marc, F., Maneux, C., Zimmer, T., Nodjiadjim, V., Riet, M., Dupuy, J.-Y., Godin, J.
Published in Microelectronics and reliability (01.09.2011)
Published in Microelectronics and reliability (01.09.2011)
Get full text
Journal Article
Conference Proceeding
Preliminary results of storage accelerated aging test on InP/InGaAs DHBT
Koné, G.A., Grandchamp, B., Hainaut, C., Marc, F., Maneux, C., Labat, N., Zimmer, T., Nodjiadjim, V., Godin, J.
Published in Microelectronics and reliability (01.09.2010)
Published in Microelectronics and reliability (01.09.2010)
Get full text
Journal Article
Conference Proceeding
Thermal aging model of InP/InGaAs/InP DHBT
Ghosh, S., Marc, F., Maneux, C., Grandchamp, B., Koné, G.A., Zimmer, T.
Published in Microelectronics and reliability (01.09.2010)
Published in Microelectronics and reliability (01.09.2010)
Get full text
Journal Article
Conference Proceeding
Advancements on reliability-aware analog circuit design
Ardouin, B., Dupuy, J.-Y, Godin, J., Nodjiadjim, V., Riet, M., Marc, F., Kone, G. A., Ghosh, S., Grandchamp, B., Maneux, C.
Published in 2012 Proceedings of the ESSCIRC (ESSCIRC) (01.09.2012)
Published in 2012 Proceedings of the ESSCIRC (ESSCIRC) (01.09.2012)
Get full text
Conference Proceeding
Advancements on reliability-aware analog circuit design
Ardouin, B., Dupuy, J-Y, Godin, J., Nodjiadjim, V., Riet, M., Marc, F., Kone, G. A., Ghosh, S., Grandchamp, B., Maneux, C.
Published in 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC) (01.09.2012)
Published in 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC) (01.09.2012)
Get full text
Conference Proceeding
Benchmarking of HBT models for InP based DHBT modeling
Ghosh, S, Zimmer, T, Ardouin, B, Maneux, C, Frégonèse, S, Marc, F, Grandchamp, B, Koné, G A
Published in 2010 27th International Conference on Microelectronics Proceedings (01.05.2010)
Published in 2010 27th International Conference on Microelectronics Proceedings (01.05.2010)
Get full text
Conference Proceeding
Preliminary results of storage accelerated aging test on InP/GaAsSb DHBT
Kone, G. A., Ghosh, S., Grandchamp, B., Maneux, C., Marc, F., Labat, N., Zimmer, T., Maher, H., Bourqui, M. L., Smith, D.
Published in IPRM 2011 - 23rd International Conference on Indium Phosphide and Related Materials (01.05.2011)
Get full text
Published in IPRM 2011 - 23rd International Conference on Indium Phosphide and Related Materials (01.05.2011)
Conference Proceeding
Submicrometer InP/InGaAs DHBT Architecture Enhancements Targeting Reliability Improvements
Kone, G. A., Grandchamp, B., Hainaut, C., Marc, F., Labat, N., Zimmer, T., Nodjiadjim, V., Riet, M., Dupuy, J., Godin, J., Maneux, C.
Published in IEEE transactions on electron devices (01.03.2013)
Published in IEEE transactions on electron devices (01.03.2013)
Get full text
Journal Article
Trends in Submicrometer InP-Based HBT Architecture Targeting Thermal Management
Grandchamp, B., Nodjiadjim, V., Zaknoune, M., Kone, G. A., Hainaut, C., Godin, J., Riet, M., Zimmer, T., Maneux, C.
Published in IEEE transactions on electron devices (01.08.2011)
Published in IEEE transactions on electron devices (01.08.2011)
Get full text
Journal Article
Analysis of InP/GaAsSb DHBT failure mechanisms under accelerated aging tests
Kone, G. A., Maneux, C., Labat, N., Zimmer, T., Grandchamp, B., Frijlink, P., Maher, H.
Published in 2012 International Conference on Indium Phosphide and Related Materials (01.08.2012)
Published in 2012 International Conference on Indium Phosphide and Related Materials (01.08.2012)
Get full text
Conference Proceeding