Search Results - "Kondracka, Kinga" :: K.UTB vyhledávací portál

TiAl-based Ohmic Contacts to p-type 4H-SiC

by Martychowiec, Agnieszka, Kwietniewski, Norbert, Kondracka, Kinga, Werbowy, Aleksander, Sochacki, Mariusz
Published in International Journal of Electronics and Telecommunications (01.01.2021)

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Influence of Multiple Cleaning on the Detection Capabilities of ISFET Structures

by Kondracka, Kinga, Firek, Piotr, Grodzik, Marta, Szmidt, Maciej, Sawosz–Chwalibóg, Ewa, Szmidt, Jan
Published in International Journal of Electronics and Telecommunications (01.01.2021)

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$Tailoring Refractive Index and Surface Sensitivity of an Optical Fiber Fabry-Perot Interferometer by a Thin Layer Deposition$

Tailoring Refractive Index and Surface Sensitivity of an Optical Fiber Fabry-Perot Interferometer by a Thin Layer Deposition

by Burnat, Dariusz, Kwietniewski, Norbert, Bartnik, Krzysztof, Koba, Marcin, Kochanowska, Olga, Kondracka, Kinga, Smietana, Mateusz
Published in Journal of lightwave technology (15.03.2023)

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TiAl-based Ohmic Contacts to p-type 4H-SiC

by Martychowiec, Agnieszka, Kwietniewski, Norbert, Kondracka, Kinga, Werbowy, Aleksander, Sochacki, Mariusz
Published in International Journal of Electronics and Telecommunications (05.07.2021)

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Influence of Multiple Cleaning on the Detection Capabilities of ISFET Structures

by Kondracka, Kinga, Firek, Piotr, Grodzik, Marta, Szmidt, Maciej, Sawosz–Chwalibóg, Ewa, Szmidt, Jan
Published in International Journal of Electronics and Telecommunications (01.12.2020)

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Journal Article

TiAl-based Ohmic Contacts to p-type 4H-SiC

Influence of Multiple Cleaning on the Detection Capabilities of ISFET Structures

Tailoring Refractive Index and Surface Sensitivity of an Optical Fiber Fabry-Perot Interferometer by a Thin Layer Deposition

TiAl-based Ohmic Contacts to p-type 4H-SiC

Influence of Multiple Cleaning on the Detection Capabilities of ISFET Structures

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