ZEC ECC: A Zero-Byte Eliminating Compression-Based ECC Scheme for DRAM Reliability
Hun Kwon, Ji, Kon Bae, Hyeong, Seo Lee, Young, Gong, Young-Ho, Woo Chung, Sung
Published in IEEE access (2024)
Published in IEEE access (2024)
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Journal Article
Twin ECC: A Data Duplication Based ECC for Strong DRAM Error Resilience
Bae, Hyeong Kon, Chung, Myung Jae, Gong, Young-Ho, Chung, Sung Woo
Published in 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.04.2023)
Published in 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.04.2023)
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Conference Proceeding