Influence of Divacancy-Oxygen Defects on Recombination Properties of n-Si Subjected to Irradiation and Subsequent Annealing
Kras’ko, M. M., Kolosiuk, A. G., Voitovych, V. V., Povarchuk, V. Yu, Roguts’kyi, I. S.
Published in Ukrainian journal of physics (Kiev) (09.12.2018)
Published in Ukrainian journal of physics (Kiev) (09.12.2018)
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Effect of tin on the processes of silicon-nanocrystal formation in amorphous SiOx thin-film matrices
Voitovych, V. V., Rudenko, R. M., Kolosiuk, A. G., Krasko, M. M., Juhimchuk, V. O., Voitovych, M. V., Ponomarov, S. S., Kraitchinskii, A. M., Povarchuk, V. Yu, Makara, V. A.
Published in Semiconductors (Woodbury, N.Y.) (2014)
Published in Semiconductors (Woodbury, N.Y.) (2014)
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The effect of Sn impurity on the optical and structural properties of thin silicon films
Voitovych, V. V., Neimash, V. B., Krasko, N. N., Kolosiuk, A. G., Povarchuk, V. Yu, Rudenko, R. M., Makara, V. A., Petrunya, R. V., Juhimchuk, V. O., Strelchuk, V. V.
Published in Semiconductors (Woodbury, N.Y.) (01.10.2011)
Published in Semiconductors (Woodbury, N.Y.) (01.10.2011)
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Journal Article
Effect of tin on the processes of silicon-nanocrystal formation in amorphous SiO x thin-film matrices
Voitovych, V. V., Rudenko, R. M., Kolosiuk, A. G., Krasko, M. M., Juhimchuk, V. O., Voitovych, M. V., Ponomarov, S. S., Kraitchinskii, A. M., Povarchuk, V. Yu, Makara, V. A.
Published in Semiconductors (Woodbury, N.Y.) (01.01.2014)
Published in Semiconductors (Woodbury, N.Y.) (01.01.2014)
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Journal Article
Effect of Tin on Structural Transformations in the Thin-Film Silicon Suboxide Matrix
Voitovych, V.V., Rudenko, R.M., Yuchymchuk, V.O., Voitovych, M.V., Krasko, M.M., Kolosiuk, A.G., Povarchuk, V.Yu, Khachevich, I.M., Rudenko, M.P.
Published in Ukrainian journal of physics (Kiev) (01.01.2016)
Published in Ukrainian journal of physics (Kiev) (01.01.2016)
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