Design and performance of a custom ASIC digitizer for wire chamber readout in 65 nm CMOS technology
Lee, M.J., Brown, D.N., Chang, J.K., Ding, D., Gnani, D., Grace, C.R., Jones, J.A., Kolomensky, Y.G., Lippe, H. von der, Mcvittie, P.J., Stettler, M.W., Walder, J.-P.
Published in Journal of instrumentation (01.06.2015)
Published in Journal of instrumentation (01.06.2015)
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