Degradation effects on the surface of commercial LiNi0.5Co0.2Mn0.3O2 electrodes
Börner, M., Horsthemke, F., Kollmer, F., Haseloff, S., Friesen, A., Niehoff, P., Nowak, S., Winter, M., Schappacher, F.M.
Published in Journal of power sources (15.12.2016)
Published in Journal of power sources (15.12.2016)
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Journal Article
Surface spectrometry using large argon clusters
Kayser, S., Rading, D., Moellers, R., Kollmer, F., Niehuis, E.
Published in Surface and interface analysis (01.01.2013)
Published in Surface and interface analysis (01.01.2013)
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Journal Article
Conference Proceeding
Lateral resolution of nanoscaled images delivered by surface-analytical instruments: application of the BAM-L200 certified reference material and related ISO standards
Senoner, M., Maaßdorf, A., Rooch, H., Österle, W., Malcher, M., Schmidt, M., Kollmer, F., Paul, D., Hodoroaba, V.-D., Rades, S., Unger, W. E. S.
Published in Analytical and bioanalytical chemistry (01.04.2015)
Published in Analytical and bioanalytical chemistry (01.04.2015)
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Journal Article
Depth profiling of organic materials using improved ion beam conditions
Cramer, H.-G., Grehl, T., Kollmer, F., Moellers, R., Niehuis, E., Rading, D.
Published in Applied surface science (15.12.2008)
Published in Applied surface science (15.12.2008)
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Journal Article
Dual beam depth profiling of organic materials: Variations of analysis and sputter beam conditions
Rading, D., Moellers, R., Kollmer, F., Paul, W., Niehuis, E.
Published in Surface and interface analysis (01.01.2011)
Published in Surface and interface analysis (01.01.2011)
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Journal Article
Conference Proceeding
Erratum to: Lateral resolution of nanoscaled images delivered by surface-analytical instruments: application of the BAM-L200 certified reference material and related ISO standards
Senoner, M., Maaßdorf, A., Rooch, H., Österle, W., Malcher, M., Schmidt, M., Kollmer, F., Paul, D., Hodoroaba, V.-D., Rades, S., Unger, W. E. S.
Published in Analytical and bioanalytical chemistry (01.04.2015)
Published in Analytical and bioanalytical chemistry (01.04.2015)
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Journal Article
Influence of primary ion bombardment conditions on the emission of molecular secondary ions
Kersting, R., Hagenhoff, B., Kollmer, F., Möllers, R., Niehuis, E.
Published in Applied surface science (15.06.2004)
Published in Applied surface science (15.06.2004)
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Journal Article
MCs+ depth profiling using cluster primary ions
Niehuis, E., Grehl, T., Kollmer, F., Moellers, R., Rading, D., Kersting, R., Hagenhoff, B.
Published in Surface and interface analysis (01.01.2011)
Published in Surface and interface analysis (01.01.2011)
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Journal Article
Conference Proceeding
Novel Cluster Ion Beams For Secondary Ion Generation, Sputtering And FIB/SIMS Application
Kollmer, F., Rading, D., Moellers, R., Cramer, H., Paul, W., Niehuis, E.
Published in Microscopy and microanalysis (01.07.2012)
Published in Microscopy and microanalysis (01.07.2012)
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Journal Article
Nonresonant Laser–SNMS and TOF–SIMS analysis of sub-μm structures
Kollmer, F., Bourdos, N., Kamischke, R., Benninghoven, A.
Published in Applied surface science (15.01.2003)
Published in Applied surface science (15.01.2003)
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Journal Article
Multivariate statistical analysis of non-mass-selected ToF-SIMS data
Smentkowski, V. S., Ostrowski, S. G., Kollmer, F., Schnieders, A., Keenan, M. R., Ohlhausen, J. A., Kotula, P. G.
Published in Surface and interface analysis (01.08.2008)
Published in Surface and interface analysis (01.08.2008)
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Journal Article
Improvement of Biological Time-of-Flight-Secondary Ion Mass Spectrometry Imaging with a Bismuth Cluster Ion Source
Touboul, David, Kollmer, Felix, Niehuis, Ewald, Brunelle, Alain, Laprévote, Olivier
Published in Journal of the American Society for Mass Spectrometry (01.10.2005)
Published in Journal of the American Society for Mass Spectrometry (01.10.2005)
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Journal Article
Cluster primary ion bombardment of organic materials
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Conference Proceeding
Journal Article
SIMS Imaging and 3D Microanalysis of Organic Structures
Havercroft, N, Rading, D, Kollmer, F, Niehuis, E
Published in Microscopy and microanalysis (01.07.2010)
Published in Microscopy and microanalysis (01.07.2010)
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Journal Article