Local anodic oxidation by atomic force microscopy for nano-Raman strain measurements on silicon–germanium thin films
Kolanek, Krzysztof, Hermann, Peter, Dudek, Piotr T., Gotszalk, Teodor, Chumakov, Dmytro, Weisheit, Martin, Hecker, Michael, Zschech, Ehrenfried
Published in Thin solid films (02.04.2010)
Published in Thin solid films (02.04.2010)
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Journal Article
In situ studies of the atomic layer deposition of thin HfO2 dielectrics by ultra high vacuum atomic force microscope
KOLANEK, Krzysztof, TALLARIDA, Massimo, KARAVAEV, Konstantin, SCHMEISSER, Dieter
Published in Thin solid films (01.06.2010)
Published in Thin solid films (01.06.2010)
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Conference Proceeding
Journal Article
Random field models of geometrically imperfect structures with “clamped” boundary conditions
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Journal Article
Conference Proceeding
Influence of the fullerene derivatives and cage polyhedral oligomeric silsesqiuoxanes on 3-aminopropyltrimethoxysilane based hybrid nanocomposites chemical, morphological and electrical properties
Klocek, Jolanta, Kolanek, Krzysztof, Henkel, Karsten, Zschech, Ehrenfried, Schmeisser, Dieter
Published in The Journal of physics and chemistry of solids (01.01.2013)
Published in The Journal of physics and chemistry of solids (01.01.2013)
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Journal Article
Studies of the chemical and electrical properties of fullerene and 3-aminopropyltrimethoxysilane based low-k materials
Klocek, Jolanta, Henkel, Karsten, Kolanek, Krzysztof, Broczkowska, Katarzyna, Schmeisser, Dieter, Miller, Mirosław, Zschech, Ehrenfried
Published in Thin solid films (31.01.2012)
Published in Thin solid films (31.01.2012)
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Journal Article
Spectroscopic and capacitance–voltage characterization of thin aminopropylmethoxysilane films doped with copper phthalocyanine, tris(dimethylvinylsilyloxy)–POSS and fullerene cages
Klocek, Jolanta, Henkel, Karsten, Kolanek, Krzysztof, Zschech, Ehrenfried, Schmeißer, Dieter
Published in Applied surface science (01.03.2012)
Published in Applied surface science (01.03.2012)
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Journal Article
Atomic layer deposition reactor for fabrication of metal oxides
Kolanek, Krzysztof, Tallarida, Massimo, Michling, Marcel, Karavaev, Konstantin, Schmeisser, Dieter
Published in Physica status solidi. C (01.04.2011)
Published in Physica status solidi. C (01.04.2011)
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Journal Article
In-Situ Studies of ALD Growth of Hafnium Oxide Films
Karavaev, Konstantin, Kolanek, Krzysztof, Tallarida, Massimo, Schmeißer, Dieter, Zschech, Ehrenfried
Published in Advanced engineering materials (01.04.2009)
Published in Advanced engineering materials (01.04.2009)
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Journal Article
In situ measurements of the atomic layer deposition of high-k dielectrics by atomic force microscope for advanced microsystems
Kolanek, Krzysztof, Tallarida, Massimo, Karavaev, Konstantin, Schmeisser, Dieter
Published in 2009 International Students and Young Scientists Workshop "Photonics and Microsystems" (01.06.2009)
Published in 2009 International Students and Young Scientists Workshop "Photonics and Microsystems" (01.06.2009)
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Conference Proceeding
Calibration of atomic force microscope for nanoscale friction measurements
Masalska, A., Kolanek, K., Woszczyna, M., Zawierucha, P., Ritz, Y., Zschech, E.
Published in 2007 International Students and Young Scientists Workshop on Photonics and Microsystems (01.07.2007)
Published in 2007 International Students and Young Scientists Workshop on Photonics and Microsystems (01.07.2007)
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Conference Proceeding
Fullerene based materials for ultra-low-k application
Broczkowska, K, Klocek, J, Friedrich, D, Henkel, K, Kolanek, K, Urbanowicz, A, Schmeisser, D, Miller, M, Zschech, E
Published in 2010 International Students and Young Scientists Workshop "Photonics and Microsystems" (01.06.2010)
Published in 2010 International Students and Young Scientists Workshop "Photonics and Microsystems" (01.06.2010)
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Conference Proceeding