Investigation of flicker noise in silicon diodes under reverse bias
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Conference Proceeding
Transient effects on high voltage diode stack under reverse bias
Papež, V., Kojecký, B., Kožı́šek, J., Hejhal, J.
Published in Microelectronics and reliability (01.04.2003)
Published in Microelectronics and reliability (01.04.2003)
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Improving of large-area GTO homogeneity by electron irradiation
Benda, Vítězslav, Špu̇r, Pavel, Kojecký, Bedřich
Published in Microelectronics and reliability (1994)
Published in Microelectronics and reliability (1994)
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