Fabrication and characterization of multilayer zone plate for hard X-rays
SAITOH, K, INAGAWA, K, KOHRA, K, HAYASHI, C, IIDA, A, KATO, N
Published in Japanese Journal of Applied Physics (01.11.1988)
Published in Japanese Journal of Applied Physics (01.11.1988)
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Fluorescence-detected X-ray absorption spectroscopy applied to structural characterization of very thin films; ion-beam-induced modification of thin Ni layers on Si(100)
OYANAGI, H, MATSUSHITA, T, TANOUE, H, ISHIGURO, T, KOHRA, K
Published in Japanese Journal of Applied Physics (01.01.1985)
Published in Japanese Journal of Applied Physics (01.01.1985)
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EXAFS Spectroscopy of Some Iron(III) Compounds by Use of Dispersive-type In-laboratory X-Ray Spectrometer
Nomura, Masaharu, Asakura, Kiyotaka, Kaminaga, Ukyo, Matsushita, Tadashi, Kohra, Kazutake, Kuroda, Haruo
Published in Bulletin of the Chemical Society of Japan (01.12.1982)
Published in Bulletin of the Chemical Society of Japan (01.12.1982)
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A Dispersive Method of Measuring Extended X-Ray Absorption Fine Structure
Kaminaga, Ukyo, Matsushita, Tadashi, Kohra, Kazutake
Published in Japanese Journal of Applied Physics (01.01.1981)
Published in Japanese Journal of Applied Physics (01.01.1981)
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Rotation of the Electric Vector of the Polarized X-Rays by Diffraction in Crystals
Annaka, Shoichi, Kohra, Kazutake, Ando, Masami
Published in Japanese Journal of Applied Physics (01.01.1981)
Published in Japanese Journal of Applied Physics (01.01.1981)
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A Study on Equal-Thickness Fringes in a Silicon Crystal by Means of an X-ray Video Imaging Device
Hashizume, Hiroo, Ishida, Hidenobu, Kohra, Kazutake
Published in Japanese Journal of Applied Physics (01.01.1971)
Published in Japanese Journal of Applied Physics (01.01.1971)
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