Experimental evaluation of Physically Unclonable Functions in 65 nm CMOS
Maes, R., Rozic, V., Verbauwhede, I., Koeberl, P., van der Sluis, E., van der Leest, Vincent
Published in 2012 Proceedings of the ESSCIRC (ESSCIRC) (01.09.2012)
Published in 2012 Proceedings of the ESSCIRC (ESSCIRC) (01.09.2012)
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