Transitioning eMRAM from Pilot Project to Volume Production
Dray, Cyrille, Gelda, Khushal, Nadeau-Dostie, Benoit, Zou, Wei, Romain, Luc, Yun, Ongsin, Kodali, Harshitha, Schramm, Lori, Keim, Martin
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
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