Dynamical X‐ray diffraction theory: Characterization of defects and strains in as‐grown and ion‐implanted garnet structures
Olikhovskii, S. I., Molodkin, V. B., Skakunova, O. S., Len, E. G., Kyslovskyy, Ye. M., Vladimirova, T. P., Reshetnyk, O. V., Kochelab, E. V., Lizunova, S. V., Pylypiv, V. M., Ostafiychuk, B. K., Garpul, O. Z.
Published in physica status solidi (b) (01.07.2017)
Published in physica status solidi (b) (01.07.2017)
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Journal Article
Dynamical Theory of Triple-Crystal X-ray Diffractometry and Characterization of Microdefects and Strains in Imperfect Single Crystals
Molodkin, V. B., Olikhovskii, S. I., Len, E. G., Kyslovskyy, Ye. M., Reshetnyk, O. V., Vladimirova, T. P., Sheludchenko, B. V., Skakunova, E. S., Lizunov, V. V., Kochelab, E. V., Fodchuk, I. M., Klad’ko, V. P.
Published in Metallofizika i noveĭshie tekhnologii (23.03.2016)
Published in Metallofizika i noveĭshie tekhnologii (23.03.2016)
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X-ray diffraction characterization of microdefects in silicon crystals after high-energy electron irradiation
Molodkin, V. B., Olikhovskii, S. I., Len, E. G., Sheludchenko, B. V., Lizunova, S. V., Kyslovs'kyy, Ye. M., Vladimirova, T. P., Kochelab, E. V., Reshetnyk, O. V., Dovganyuk, V. V., Fodchuk, I. M., Lytvynchuk, T. V., Klad'ko, V. P., Świątek, Z.
Published in Physica status solidi. A, Applications and materials science (01.11.2011)
Published in Physica status solidi. A, Applications and materials science (01.11.2011)
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Journal Article
Evolution of the microdefect structure in silicon on isothermal annealing as determined by X-ray diffractometry
Kyslovskyy, Ye. M., Vladimirova, T. P., Olikhovskii, S. I., Molodkin, V. B., Kochelab, E. V., Seredenko, R. F.
Published in Physica status solidi. A, Applications and materials science (01.08.2007)
Published in Physica status solidi. A, Applications and materials science (01.08.2007)
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Conference Proceeding
Dispersion (Phase) Nature of Structural Sensitivity and Informativity of Triple-Crystal Diffractometry of Defects and Strains within the Ion-Implanted Films
Skakunova, O. S., Olikhovskii, S. I., Molodkin, V. B., Len, E. G., Kislovskii, E. M., Reshetnyk, O. V., Vladimirova, T. P., Kochelab, E. V., Lizunov, V. V., Lizunova, S. V., Makivs’ka, V. L., Tolmachov, M. G., Skapa, L. M., Vasylyk, Ya. V., Fuzik, K. V.
Published in Metallofizika i noveĭshie tekhnologii (17.08.2016)
Published in Metallofizika i noveĭshie tekhnologii (17.08.2016)
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X-ray diffraction characterization of microdefects in silicon crystals after high-energy electron irradiation : High-resolution X-ray Diffraction and Imaging
MOLODKIN, V. B, OLIKHOVSKII, S. I, FODCHUK, I. M, LYTVYNCHUK, T. V, KLAD'KO, V. P, SWIATEK, Z, LEN, E. G, SHELUDCHENKO, B. V, LIZUNOVA, S. V, KYSLOVS'KYY, Ye. M, VLADIMIROVA, T. P, KOCHELAB, E. V, RESHETNYK, O. V, DOVGANYUK, V. V
Published in Physica status solidi. A, Applications and materials science (2011)
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Published in Physica status solidi. A, Applications and materials science (2011)
Journal Article
Combined multiparametric X-ray diffraction diagnostics of microdefects in silicon crystals after irradiation by high-energy electrons
Kislovskii, E. N., Molodkin, V. B., Olikhovskii, S. I., Len, E. G., Sheludchenko, B. V., Lizunova, S. V., Vladimirova, T. P., Kochelab, E. V., Reshetnyk, O. V., Dovganyuk, V. V., Fodchuk, I. M., Lytvynchuk, T. V., Klad’ko, V. P.
Published in Surface investigation, x-ray, synchrotron and neutron techniques (01.05.2013)
Published in Surface investigation, x-ray, synchrotron and neutron techniques (01.05.2013)
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