Electrical Properties and Reliability Analysis of Solution-Processed Indium Tin Zinc Oxide Thin Film Transistors with O2-Plasma Treatment
Ko, Sun Wook, Kim, Soon Kon, Kim, Jong Min, Cho, Jae Hee, Park, Hyoung Sun, Choi, Byoung Deog
Published in Journal of nanoscience and nanotechnology (01.10.2015)
Published in Journal of nanoscience and nanotechnology (01.10.2015)
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