Degradation and silicidation of Ta- and W-filaments for different filament temperatures
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Journal Article
Conference Proceeding
CPM measurements on a-Si:H based pin cells-a critical investigation
Geyer, R., Gorn, M., Kniffler, N., Lechner, P., Rubel, H., Scheppat, B.
Published in Conference Record of the Twentieth IEEE Photovoltaic Specialists Conference (1988)
Published in Conference Record of the Twentieth IEEE Photovoltaic Specialists Conference (1988)
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Conference Proceeding
The density of states (DOS) of i-layers in a Si:H based pin cells determined by CPM measurements
Rubel, H., Geyer, R., Scheppat, B., Lechner, P., Gorn, M., Kniffler, N.
Published in IEEE Conference on Photovoltaic Specialists (1990)
Published in IEEE Conference on Photovoltaic Specialists (1990)
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Conference Proceeding