Influence of spatial and temporal coherences on atomic resolution high angle annular dark field imaging
Beyer, Andreas, Belz, Jürgen, Knaub, Nikolai, Jandieri, Kakhaber, Volz, Kerstin
Published in Ultramicroscopy (01.10.2016)
Published in Ultramicroscopy (01.10.2016)
Get full text
Journal Article
Quantification of Bi distribution in MOVPE-grown Ga(AsBi) via HAADF STEM
Knaub, Nikolai, Beyer, Andreas, Wegele, Tatjana, Ludewig, Peter, Volz, Kerstin
Published in Journal of crystal growth (01.01.2016)
Published in Journal of crystal growth (01.01.2016)
Get full text
Journal Article
Local Bi ordering in MOVPE grown Ga(As,Bi) investigated by high resolution scanning transmission electron microscopy
Beyer, Andreas, Knaub, Nikolai, Rosenow, Phil, Jandieri, Kakhaber, Ludewig, Peter, Bannow, Lars, Koch, Stephan W., Tonner, Ralf, Volz, Kerstin
Published in Applied materials today (01.03.2017)
Published in Applied materials today (01.03.2017)
Get full text
Journal Article
Determination of the chemical composition of GaNAs using STEM HAADF imaging and STEM strain state analysis
Grieb, Tim, Müller, Knut, Fritz, Rafael, Schowalter, Marco, Neugebohrn, Nils, Knaub, Nikolai, Volz, Kerstin, Rosenauer, Andreas
Published in Ultramicroscopy (01.06.2012)
Published in Ultramicroscopy (01.06.2012)
Get full text
Journal Article
Interface engineering and characterization at the atomic‐scale of pure and mixed ion layer gas reaction buffer layers in chalcopyrite thin‐film solar cells
Cojocaru‐Mirédin, Oana, Fu, Yanpeng, Kostka, Aleksander, Sáez‐Araoz, Rodrigo, Beyer, Andreas, Knaub, Nikolai, Volz, Kerstin, Fischer, Christian‐Herbert, Raabe, Dierk
Published in Progress in photovoltaics (01.06.2015)
Published in Progress in photovoltaics (01.06.2015)
Get full text
Journal Article
Interface engineering and characterization at the atomic-scale of pure and mixed ion layer gas reaction buffer layers in chalcopyrite thin-film solar cells: Engineering and characterization of pure and mixed ILGAR buffer layers
Cojocaru-Mirédin, Oana, Fu, Yanpeng, Kostka, Aleksander, Sáez-Araoz, Rodrigo, Beyer, Andreas, Knaub, Nikolai, Volz, Kerstin, Fischer, Christian-Herbert, Raabe, Dierk
Published in Progress in photovoltaics (01.06.2015)
Published in Progress in photovoltaics (01.06.2015)
Get full text
Journal Article
Migration-enhanced epitaxy of thin GaAsBi layers
Butkutė, Renata, Pačebutas, Vaidas, Krotkus, Arūnas, Knaub, Nikolai, Volz, Kerstin
Published in Lithuanian journal of physics (2014)
Published in Lithuanian journal of physics (2014)
Get full text
Journal Article
Method of automatically focusing a charged particle beam on a surface region of a sample, method of calculating a converging set of sharpness values of images of a charged particle beam device and charged particle beam device for imaging a sample
Trauner, Robert, Mueller, Bernhard G, Knaub, Nikolai, Virdi, Kulpreet Singh, Schüler, Bernhard
Year of Publication 21.03.2023
Get full text
Year of Publication 21.03.2023
Patent
METHOD OF AUTOMATICALLY FOCUSING A CHARGED PARTICLE BEAM ON A SURFACE REGION OF A SAMPLE, METHOD OF CALCULATING A CONVERGING SET OF SHARPNESS VALUES OF IMAGES OF A CHARGED PARTICLE BEAM DEVICE AND CHARGED PARTICLE BEAM DEVICE FOR IMAGING A SAMPLE
KNAUB, Nikolai, VIRDI, Kulpreet Singh, TRAUNER, Robert, SCHÜLER, Bernhard, MUELLER, Bernhard G
Year of Publication 16.02.2022
Get full text
Year of Publication 16.02.2022
Patent
METHOD OF AUTOMATICALLY FOCUSING A CHARGED PARTICLE BEAM ON A SURFACE REGION OF A SAMPLE, METHOD OF CALCULATING A CONVERGING SET OF SHARPNESS VALUES OF IMAGES OF A CHARGED PARTICLE BEAM DEVICE AND CHARGED PARTICLE BEAM DEVICE FOR IMAGING A SAMPLE
KNAUB, Nikolai, VIRDI, Kulpreet Singh, TRAUNER, Robert, SCHÜLER, Bernhard, MUELLER, Bernhard G
Year of Publication 10.02.2022
Get full text
Year of Publication 10.02.2022
Patent