China’s Nuclear Weapons and the Prospects for Multilateral Arms Control
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Journal Article
Trade Publication Article
dV/dt Immunity of Half Bridges Based on 650V Enhancement Mode GaN HEMTs
Fiori, Franco, Nubling, Marcus, Klotz, Frank
Published in 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe) (04.09.2023)
Published in 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe) (04.09.2023)
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Conference Proceeding
Uncertainty of CAN RF Emission Test Results due to Common Mode Choke Asymmetry
Miropolsky, Sergey, Roebl, Marlon
Published in 2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE (01.09.2019)
Published in 2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE (01.09.2019)
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Conference Proceeding
On chip filtering versus layout techniques to reduce RF coupled disturbances
Schröter, P, Klotz, F
Published in 2010 IEEE International Symposium on Electromagnetic Compatibility (01.07.2010)
Published in 2010 IEEE International Symposium on Electromagnetic Compatibility (01.07.2010)
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Conference Proceeding
Modeling and Measurement of RF-Emissions at Transceiver Pins in Automotive System ICs caused by Integrated DC/DC-Converters
Schade, Alexander, Klotz, Frank, Jahn, Stefan, Weigel, Robert
Published in 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE (23.09.2020)
Published in 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE (23.09.2020)
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Conference Proceeding
Improving the immunity of smart power integrated circuits by controlling RF substrate coupling
Schroter, P., Jahn, S., Klotz, F.
Published in 2011 IEEE International Symposium on Electromagnetic Compatibility (01.08.2011)
Published in 2011 IEEE International Symposium on Electromagnetic Compatibility (01.08.2011)
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Conference Proceeding
S-EHRFEM - Substrate Extraction using Highly Reduced FEM-meshes for Transient SPICE-simulation with Iterative Linear Solvers
Schade, Alexander, Klotz, Frank, Jahn, Stefan, Weigel, Robert
Published in 2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE (01.09.2019)
Published in 2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE (01.09.2019)
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Conference Proceeding
EMC test specification for integrated circuits
Klotz, Frank
Published in 2007 18th International Zurich Symposium on Electromagnetic Compatibility (01.09.2007)
Published in 2007 18th International Zurich Symposium on Electromagnetic Compatibility (01.09.2007)
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Conference Proceeding
Error of emission measurement of ICs due to imperfect termination of TEM Cell
Mullerwiebus, V., Deutschmann, B., Klotz, F.
Published in 2008 International Symposium on Electromagnetic Compatibility - EMC Europe (01.09.2008)
Published in 2008 International Symposium on Electromagnetic Compatibility - EMC Europe (01.09.2008)
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Conference Proceeding
Experimental validation of the generalized accurate modelling method for system-level bulk current injection setups up to 1 GHz
Miropolsky, Sergey, Jahn, Stefan, Klotz, Frank, Frei, Stephan
Published in 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) (01.11.2015)
Published in 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) (01.11.2015)
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Conference Proceeding
New standardized EMC evaluation methods for communication transceivers
Klotz, Frank, Robl, Marlon, Korber, Bernd, Muller, Norman
Published in 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC) (01.05.2018)
Published in 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC) (01.05.2018)
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Conference Proceeding