Sensitivity and resolution of evanescent microwave microscope
Kleismit, R.A., Kazimierczuk, M.K., Kozlowski, G.
Published in IEEE transactions on microwave theory and techniques (01.02.2006)
Published in IEEE transactions on microwave theory and techniques (01.02.2006)
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Journal Article
Characterization of Local Dielectric Properties of Superconductor $rm YBa_2rm Cu_3rm O_7-delta$ Using Evanescent Microwave Microscopy
Kleismit, R.A., Kozlowski, G., Biggers, R., Maartense, I., Kazimierczuk, M.K., Mast, D.B.
Published in IEEE transactions on applied superconductivity (01.06.2005)
Published in IEEE transactions on applied superconductivity (01.06.2005)
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Journal Article
Characterization of local dielectric properties of superconductor YBa2Cu3O7-[delta] using evanescent microwave microscopy
Kleismit, R.A, Kozlowski, G, Biggers, R, Maartense, I, Kazimierczuk, M.K, Mast, D.B
Published in IEEE transactions on applied superconductivity (01.05.2005)
Published in IEEE transactions on applied superconductivity (01.05.2005)
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Journal Article
Characterization of local dielectric properties of superconductor YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// using evanescent microwave microscopy
Kleismit, R.A., Kozlowski, G., Biggers, R., Maartense, I., Kazimierczuk, M.K., Mast, D.B.
Published in IEEE transactions on applied superconductivity (01.06.2005)
Published in IEEE transactions on applied superconductivity (01.06.2005)
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Journal Article
Evanescent microwave microscopy of thermally-damaged charge coupled devices
Kleismit, R.A., Kazimierczuk, M.K.
Published in Proceedings: Electrical Insulation Conference and Electrical Manufacturing and Coil Winding Technology Conference (Cat. No.03CH37480) (2003)
Published in Proceedings: Electrical Insulation Conference and Electrical Manufacturing and Coil Winding Technology Conference (Cat. No.03CH37480) (2003)
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