Personal Health Records Success: Why Google Health Failed and What Does that Mean for Microsoft HealthVault?
Spil, Ton, Klein, Richard
Published in 2014 47th Hawaii International Conference on System Sciences (01.01.2014)
Published in 2014 47th Hawaii International Conference on System Sciences (01.01.2014)
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Conference Proceeding
The effect of a width transition on the electromigration reliability of Cu interconnects
Hau-Riege, C., Klein, R.
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
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Conference Proceeding
A Plasma Damage Mitigation Concept for SOI Technologies: Lightning Rods
Pelella, Mario M., Zhou, JR, Eppes, David, Leary, Mike, Hale, Stephen, Noorlag, Date, Bullard, Larry, Huebler, Peter, Schuler, Stefan, Dreizner, Andreas, Working, Jim, Chan, Darin, Schwan, Christoph, Horstmann, Manfred, En, Bill, Wieczorek, Karsten, Greenlaw, David, Heidel, Thomas, Heinig, Volker, Miethke, John, Kepler, Nick, Kruegel, Stephan, Frohberg, Kai, Rivers, Jason, Heller, Thomas, Richter, Ralf, Rodriguez, Norma, Klein, Rich
Published in 2007 IEEE International SOI Conference (01.10.2007)
Published in 2007 IEEE International SOI Conference (01.10.2007)
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Conference Proceeding
Minimizing transistor size in integrated circuits
SPENCE CHRISTOPER A, HORNE STEPHEN C, LEE RAYMOND T, KLEIN RICH K, HOLST JOHN C, SANDER CRAIG S, SELCUK ASIM A, KEPLER NICHOLAS J
Year of Publication 11.04.2006
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Year of Publication 11.04.2006
Patent
Minimizing transistor size in integrated circuits
Sander, Craig S, Klein, Rich K, Selcuk, Asim A, Kepler, Nicholas J, Spence, Christoper A, Lee, Raymond T, Holst, John C, Horne, Stephen C
Year of Publication 11.04.2006
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Year of Publication 11.04.2006
Patent
Subtractive dual damascene semiconductor device
GUPTA; SUBHASH, KLEIN; RICH, AVANZINO; STEVEN, LUNING; SCOTT D, LIN; MING-RIN
Year of Publication 18.04.2000
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Year of Publication 18.04.2000
Patent