A Novel Inspection System For Variable Data Printing Using Deep Learning
Haik, Oren, Perry, Oded, Chen, Eli, Klammer, Peter
Published in 2020 IEEE Winter Conference on Applications of Computer Vision (WACV) (01.03.2020)
Published in 2020 IEEE Winter Conference on Applications of Computer Vision (WACV) (01.03.2020)
Get full text
Conference Proceeding