Interface characterization of molecular-monolayer/SiO2 based molecular junctions
RICHTER, C. A, HACKER, C. A, RICHTER, L. J, KIRILLOV, O. A, SUEHLE, J. S, VOGEL, E. M
Published in Solid-state electronics (01.06.2006)
Published in Solid-state electronics (01.06.2006)
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Conference Proceeding
Journal Article
Band alignment of metal-oxide-semiconductor structure by internal photoemission spectroscopy and spectroscopic ellipsometry
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Journal Article
Conference Proceeding
Interface characterization of molecular-monolayer/SiO 2 based molecular junctions
Richter, C.A., Hacker, C.A., Richter, L.J., Kirillov, O.A., Suehle, J.S., Vogel, E.M.
Published in Solid-state electronics (2006)
Published in Solid-state electronics (2006)
Get full text
Journal Article