Characterization of the Vertical Position of the Trapped Charge in Charge-trap Flash Memory
Kim, Seunghyun, Kwon, Dae Woong, Lee, Sang-Ho, Park, Sang-Ku, Kim, Youngmin, Kim, Hyungmin, Kim, Young Goan, Cho, Seongjae, Park, Byung-Gook
Published in Journal of semiconductor technology and science (2017)
Get full text
Published in Journal of semiconductor technology and science (2017)
Journal Article
Characterization of the Vertical Position of the Trapped Charge in Charge-trap Flash Memory
Seunghyun Kim, Dae Woong Kwon, Sang-Ho Lee, Sang-Ku Park, Youngmin Kim, Hyungmin Kim, Young Goan Kim, Seongjae Cho, Byung-Gook Park
Published in Journal of semiconductor technology and science (01.04.2017)
Published in Journal of semiconductor technology and science (01.04.2017)
Get full text
Journal Article