How do latecomer firms achieve catch-up through technology management: a comparative analysis
Liu, Yexin, Wu, Weiwei, Kim, Yanggi
Published in Humanities & social sciences communications (01.12.2023)
Published in Humanities & social sciences communications (01.12.2023)
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Journal Article
A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method
Junghyun Nam, Sunghoon Chun, Gibum Koo, Yanggi Kim, Byungsoo Moon, Jonghyoung Lim, Jaehoon Joo, Sangseok Kang, Hoonjung Kim, Kyeongseon Shin, Kisang Kang, Sungho Kang
Published in 2008 IEEE International Test Conference (01.10.2008)
Published in 2008 IEEE International Test Conference (01.10.2008)
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Conference Proceeding
How does emotional conflict affect innovation behavior?
Wu, Weiwei, Liu, Yexin, Kim, Yanggi, Gao, Pengbin
Published in The International journal of conflict management (16.05.2018)
Published in The International journal of conflict management (16.05.2018)
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Journal Article