Degradation Phenomenon of p+ to p+ Isolation Characteristics Caused by Carrier Injection in a High-Voltage Process
Kim, Seong-Ho, Jo, Sung-Il, Park, Joo-Han, Kim, Sung-Hoan, Kim, Eun-Soo, Kim, Byung-Sun, Lee, Soo-Cheol, Choi, Chang-Sik
Published in Japanese Journal of Applied Physics (01.11.2003)
Published in Japanese Journal of Applied Physics (01.11.2003)
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Journal Article
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KIM SUNG HOAN, LIM YOUNG KYU, JOO CHANG EUN, JUNG KYUNG MOON, KWON YONG HWAN, PARK SEONG HWAN
Year of Publication 23.11.2020
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Year of Publication 23.11.2020
Patent
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KWON CHIL WOO, KIM SUNG HOAN, LIM YOUNG KYU, JOO CHANG EUN, CHOI GYU JIN, LEE SUNG UK
Year of Publication 27.10.2020
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Year of Publication 27.10.2020
Patent
Analysis on Distortion of Fan-Out Panel Level Packages (FOPLP)
Park, Yongjin, Kim, Bong-Soo, Ko, Tae-Ho, Kim, Sung-Hoan, Lee, Seok Won, Cho, Tae-Je
Published in 2021 IEEE 71st Electronic Components and Technology Conference (ECTC) (01.06.2021)
Published in 2021 IEEE 71st Electronic Components and Technology Conference (ECTC) (01.06.2021)
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Conference Proceeding
METHODS OF MANUFACTURING A BUMP WITH IMPROVED THE PERFORMANCE OF CONNECTION BETWEEN BONDING PAD METAL
KIM, HYUN WOO, LEE, EUN YOUNG, CHOI, YOUNG SIK, KIM, SUNG HOAN, JO, SUNG IL, KIM, MYOUNG SOO, LIM, SEUNG GU, LEE, DONG CHUL, KIM, HYOUN SOO, KANG, JUN GU
Year of Publication 24.05.2010
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Year of Publication 24.05.2010
Patent
Semiconductor package
Joo, Chang Eun, Jung, Kyung Moon, Park, Seong Hwan, Kwon, Yong Hwan, Kim, Sung Hoan, Lim, Young Kyu
Year of Publication 08.02.2022
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Year of Publication 08.02.2022
Patent
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PARK, Seong Hwan, LIM, Young Kyu, JOO, Chang Eun, KIM, Sung Hoan, KWON, Yong Hwan, JUNG, Kyung Moon
Year of Publication 19.11.2020
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Year of Publication 19.11.2020
Patent
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Joo, Chang Eun, Lee, Sung Uk, Choi, Gyu Jin, Kwon, Chil Woo, Kim, Sung Hoan, Lim, Young Kyu
Year of Publication 22.10.2020
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Year of Publication 22.10.2020
Patent