New Method for Reduction of the Capacitor Leakage Failure Rate Without Changing the Capacitor Structure or Materials in DRAM Mass Production
Lee, Jong-Min, Choi, Pyung-Ho, Kim, Soon-Kon, Oh, Jung-Hwan, Shin, Soo-Ho, Noh, Jun-Yong, Kim, Hyoung-Sub, Choi, Byoung-Deog
Published in IEEE transactions on electron devices (01.11.2018)
Published in IEEE transactions on electron devices (01.11.2018)
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Journal Article
Channel Defect Analysis Method of a-IGZO TFTs on Polyimide for Flexible Displays
Kim, Hyo-Jung, Song, Jang-Kun, Choi, Byoung-Deog, Jeon, Bo-Hyeon, Park, Jong-Woo, Kim, June-Hwan, Kim, Soon-Kon, Song, Min-Jun, Choi, Pyung-Ho, Park, Jung-Min, Kim, Ki-Hwan
Published in Journal of semiconductor technology and science (01.10.2020)
Published in Journal of semiconductor technology and science (01.10.2020)
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Journal Article